Inventor · disambiguated record
Michael Allgauer
Also filed as: ALLGAEUER MICHAEL · ALLGAUER MICHAEL
8 granted patents·1 pending application·152 citations·filing 1990–2003
88Inventor score
Top patents by PatentIndex Score
9 records- 0179US5424833AInterferential linear and angular displacement apparatus having scanning and scale grating respectively greater than and less than the source wavelengthHEIDENHAIN GMBH DR JOHANNES·Filed 1993·Granted Jun 13, 1995·36 cites·36 claims
- 0271US5786931APhase grating and method of producing phase gratingHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted Jul 28, 1998·32 cites·11 claims
- 0368US6445456B2Photoelectric position measuring deviceJOHANNAS HEIDENHAIN GMBH DR·Filed 1997·Granted Sep 3, 2002·31 cites·21 claims
- 0456US5271078ADevice for coupling and/or decoupling beams of light, with an integrated optical componentHEIDENHAIN GMBH DR JOHANNES·Filed 1992·Granted Dec 14, 1993·19 cites·24 claims
- 0551US5127733AIntegrated optical precision measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 1990·Granted Jul 7, 1992·17 cites·19 claims
- 0643US5187545AIntegrated optical position measuring device and method with reference and measurement signalsHEIDENHAIN GMBH DR JOHANNES·Filed 1990·Granted Feb 16, 1993·12 cites·16 claims
- 0736US6800404B2Method for producing a self-supporting electron-optical transparent structure, and structure produced in accordance with the methodHEIDENHAIN GMBH DR JOHANNES·Filed 2002·Granted Oct 5, 2004·0 cites·13 claims
- 0835US2004090677A1Material measure in the form of an amplitude grating, as well as a position measuring systemFiled 2003·Application pending·0 cites
- 0930US5963330AOptical position measuring deviceHEIDENHAIN GMBH DR JOHANNES·Filed 1997·Granted Oct 5, 1999·5 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →