Inventor · disambiguated record
Michael Buet
Also filed as: BUET MICHAEL · BUET MICHAEL P
10 granted patents·67 citations·filing 1994–2021
86Inventor score
Top patents by PatentIndex Score
10 records- 0194US10673062B1Method and system for thermal gradient during electrode pyrolysisENEVATE CORP·Filed 2019·Granted Jun 2, 2020·5 cites·27 claims
- 0280US11618800B2Composition and method for lamination of silicon dominant electrodesENEVATE CORP·Filed 2021·Granted Apr 4, 2023·0 cites·16 claims
- 0379US11600809B2Method and system for thermal gradient during electrode pyrolysisENEVATE CORP·Filed 2021·Granted Mar 7, 2023·0 cites·25 claims
- 0474US11223034B2Method and system for thermal gradient during electrode pyrolysisENEVATE CORP·Filed 2020·Granted Jan 11, 2022·0 cites·25 claims
- 0572US6053984AMethod and apparatus for decomposition of silicon oxide layers for impurity analysis of silicon wafersFiled 1997·Granted Apr 25, 2000·42 cites·10 claims
- 0667US11203657B2Composition and method for lamination of silicon dominant electrodesENEVATE CORP·Filed 2019·Granted Dec 21, 2021·0 cites·44 claims
- 0761US6475291B1Method and apparatus for decomposition of silicon oxide layers for impurity analysis of silicon wafersBEECH GROVE TECHNOLOGY INC·Filed 2000·Granted Nov 5, 2002·6 cites·5 claims
- 0837US5569328ASilicon semiconductor wafer testFiled 1995·Granted Oct 29, 1996·9 cites·8 claims
- 0934US6273992B1Method and apparatus for decomposition of silicon oxide layers for impurity analysis of silicon wafersFiled 2000·Granted Aug 14, 2001·2 cites·18 claims
- 1028US5481881ASystem and process for removing potential pollutants from a vapor streamFiled 1994·Granted Jan 9, 1996·3 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →