Inventor · disambiguated record
Ming-Huei Chen
Also filed as: CHEN MING-HUEI
3 granted patents·9 pending applications·32 citations·filing 2006–2011
67Inventor score
Files withATOMIC ENERGY COUNCIL6WENG CHANG-JIAN2BEAM GENE CORP LTD1BENQ MATERIALS CORP1LIN SHIH-PIN1
Top patents by PatentIndex Score
12 records- 0187US7507941B2Hybrid mode sun-tracking apparatus having photo sensorATOMIC ENERGY COUNCIL·Filed 2006·Granted Mar 24, 2009·22 cites·16 claims
- 0274US7857468B2Antiglare film and method of forming the sameBENQ MATERIALS CORP·Filed 2008·Granted Dec 28, 2010·9 cites·22 claims
- 0350US2010076110A1Reactive polymer and hard coating compositionWENG CHANG-JIAN·Filed 2009·Application pending·0 cites
- 0447US2007272826A1Solar tracker standATOMIC ENERGY COUNCIL·Filed 2006·Application pending·0 cites
- 0546US2010068504A1Multiple-coating particle and anti-glare film having the sameLIN SHIH-PIN·Filed 2009·Application pending·0 cites
- 0640US7508311B2Radwaste warehouse area monitoring systemATOMIC ENERGY COUNCIL·Filed 2006·Granted Mar 24, 2009·1 cites·8 claims
- 0740US2010104851A1Optical film and method of making the sameWENG CHANG-JIAN·Filed 2009·Application pending·0 cites
- 0836US2011026659A1Control loop for a power plantATOMIC ENERGY COUNCIL·Filed 2008·Application pending·0 cites
- 0935US2011082679A1Apparatus of simulating data certification with safe network communicationATOMIC ENERGY COUNCIL·Filed 2008·Application pending·0 cites
- 1034US2009106001A1Digital I&C software failure simulation test facilityATOMIC ENERGY COUNCIL·Filed 2007·Application pending·0 cites
- 1126US2007070227A1Complementary color detection deviceBEAM GENE CORP LTD·Filed 2006·Application pending·0 cites
- 1225US2012180027A1Software verification system and method, and computer-readable medium for use with the methodYU YUAN-CHANG·Filed 2011·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Ming-Huei Chen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →