Inventor · disambiguated record
Michael Peter Costello
Also filed as: COSTELLO MICHAEL · COSTELLO MICHAEL PETER
10 granted patents·2 pending applications·28 citations·filing 2006–2007
84Inventor score
Top patents by PatentIndex Score
12 records- 0174US7388390B2Method for testing electronic componentsTELCO TESTING SYSTEMS LLC·Filed 2007·Granted Jun 17, 2008·9 cites·22 claims
- 0274US7262616B2Apparatus, method and system for testing electronic componentsTELCO TESTING SYSTEMS LLC·Filed 2006·Granted Aug 28, 2007·8 cites·31 claims
- 0367US7535214B2Apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted May 19, 2009·3 cites·22 claims
- 0452US7518357B2Test circuits of an apparatus for testing micro SD devicesCHROMA ATE INC·Filed 2007·Granted Apr 14, 2009·2 cites·22 claims
- 0552US7518356B2Apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Apr 14, 2009·2 cites·14 claims
- 0647US7545158B2Method for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Jun 9, 2009·2 cites·20 claims
- 0746US7489156B2Method for testing micro SD devices using test circuitsCHRUMA ATE INC·Filed 2007·Granted Feb 10, 2009·2 cites·20 claims
- 0838US7514914B2Test circuits of an apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Apr 7, 2009·0 cites·22 claims
- 0937US7489155B2Method for testing plurality of system-in-package devices using plurality of test circuitsCHROMA ATE INC·Filed 2007·Granted Feb 10, 2009·0 cites·20 claims
- 1037US7443190B1Method for testing micro SD devices using each test circuitsCHROMA ATE INC·Filed 2007·Granted Oct 28, 2008·0 cites·20 claims
- 1135US2008252321A1Apparatus for testing micro SD devicesSEMICONDUCTOR TESTING ADVANCED·Filed 2007·Application pending·0 cites
- 1235US2008252317A1Apparatus for testing system-in-package devicesSEMICONDUCTOR TESTING ADVANCED·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →