Inventor · disambiguated record
Michael Dorough
Also filed as: DOROUGH MICHAEL J
9 granted patents·5 pending applications·162 citations·filing 1999–2014
91Inventor score
Top patents by PatentIndex Score
14 records- 0189US7383147B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jun 3, 2008·15 cites·20 claims
- 0288US7165004B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 16, 2007·14 cites·19 claims
- 0384US7010451B2Dynamic creation and modification of wafer test maps during wafer testingMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 7, 2006·26 cites·35 claims
- 0478US6859760B2Remote semiconductor microscopyMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 22, 2005·20 cites·33 claims
- 0578US6567770B2Remote semiconductor microscopyMICRON TECHNOLOGY INC·Filed 2002·Granted May 20, 2003·21 cites·47 claims
- 0670US7139672B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 21, 2006·10 cites·23 claims
- 0769US7162386B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 9, 2007·10 cites·71 claims
- 0866US7337088B2Intelligent measurement modular semiconductor parametric test systemMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 26, 2008·9 cites·15 claims
- 0959US2015005968A1Apparatus and method for determining device participation in an energy management programENERNOC INC·Filed 2014·Application pending·0 cites
- 1048US2006212253A1Intelligent measurement modular semiconductor parametric test systemMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 1142US2006064268A1Dynamic creation and modification of wafer test maps during wafer testingMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 1242US2007112538A1Concurrent control of semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2007·Application pending·0 cites
- 1341US6370487B1Remote semiconductor microscopyMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 9, 2002·37 cites·34 claims
- 1435US2002152046A1Concurrent control of semiconductor parametric testingFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →