Inventor · disambiguated record
Min Sik Han
Also filed as: HAN MIN SIK
11 granted patents·3 pending applications·11 citations·filing 2013–2023
82Inventor score
Files withSK HYNIX INC14
Top patents by PatentIndex Score
14 records- 0178US9672884B1Semiconductor devices and semiconductor systems including the sameSK HYNIX INC·Filed 2016·Granted Jun 6, 2017·5 cites·20 claims
- 0270US8836402B2Phase splitterSK HYNIX INC·Filed 2013·Granted Sep 16, 2014·3 cites·15 claims
- 0365US10560093B1Semiconductor devicesSK HYNIX INC·Filed 2019·Granted Feb 11, 2020·1 cites·16 claims
- 0460US10276257B2Semiconductor device and system relating to the reduction of test time in a ring oscillator burn-in testSK HYNIX INC·Filed 2017·Granted Apr 30, 2019·1 cites·13 claims
- 0556US2024379134A1Semiconductor device and stack type semiconductor memory device including the sameSK HYNIX INC·Filed 2023·Application pending·0 cites
- 0655US10762933B2Semiconductor deviceSK HYNIX INC·Filed 2018·Granted Sep 1, 2020·1 cites·25 claims
- 0751US9356605B2Period measuring circuit and semiconductor device including the sameSK HYNIX INC·Filed 2014·Granted May 31, 2016·0 cites·16 claims
- 0850US11170829B2Semiconductor device performing duty ratio adjustment operationSK HYNIX INC·Filed 2020·Granted Nov 9, 2021·0 cites·21 claims
- 0946US10083762B2Semiconductor test device and semiconductor test methodSK HYNIX INC·Filed 2018·Granted Sep 25, 2018·0 cites·5 claims
- 1041US9972404B2Semiconductor test device and semiconductor test methodSK HYNIX INC·Filed 2017·Granted May 15, 2018·0 cites·9 claims
- 1139US9240246B2Semiconductor device having fuse circuitSK HYNIX INC·Filed 2014·Granted Jan 19, 2016·0 cites·15 claims
- 1234US10157651B2Semiconductor device for driving data line by using different voltagesSK HYNIX INC·Filed 2016·Granted Dec 18, 2018·0 cites·16 claims
- 1334US2019311750A1Semiconductor apparatusSK HYNIX INC·Filed 2018·Application pending·0 cites
- 1429US2016218701A1Phase control circuits and data output devices including the sameSK HYNIX INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →