Inventor · disambiguated record
Michael J. Hart
Also filed as: HART MICHAEL · HART MICHAEL J · HART MICHAEL JOHNS BEEMS
73 granted patents·9 pending applications·1,093 citations·filing 1990–2021
99Inventor score
Top patents by PatentIndex Score
82 records- 0197US6777978B2Structures and methods for selectively applying a well bias to portions of a programmable deviceXILINX INC·Filed 2003·Granted Aug 17, 2004·125 cites·28 claims
- 0297US6621325B2Structures and methods for selectively applying a well bias to portions of a programmable deviceXILINX INC·Filed 2001·Granted Sep 16, 2003·90 cites·21 claims
- 0396US9575111B1On chip detection of electrical overstress eventsXILINX INC·Filed 2013·Granted Feb 21, 2017·20 cites·10 claims
- 0494US10677716B1Systems and methods for optically determining an acoustic signature of an objectHART MICHAEL·Filed 2019·Granted Jun 9, 2020·12 cites·21 claims
- 0593US10289178B1Configurable single event latch-up (SEL) and electrical overvoltage stress (EOS) detection circuitXILINX INC·Filed 2017·Granted May 14, 2019·11 cites·20 claims
- 0693US8299564B1Diffusion regions having different depthsWU YUN·Filed 2009·Granted Oct 30, 2012·51 cites·12 claims
- 0792US10976239B1Systems and methods for determining polarization properties with high temporal bandwidthHART SCIENT CONSULTING INTERNATIONAL LLC·Filed 2020·Granted Apr 13, 2021·16 cites·20 claims
- 0892US9281807B1Master-slave flip-flops and methods of implementing master-slave flip-flops in an integrated circuitXILINX INC·Filed 2014·Granted Mar 8, 2016·12 cites·17 claims
- 0992US8261229B2Method and apparatus for interconnect layout in an integrated circuitHART MICHAEL J·Filed 2010·Granted Sep 4, 2012·16 cites·19 claims
- 1090US10228323B1Systems and methods for optically determining an acoustic signature of an objectHART MICHAEL·Filed 2018·Granted Mar 12, 2019·8 cites·20 claims
- 1190US8692381B1Integrated circuits with a resistance to single event upset occurrence and methods for providing the sameHART MICHAEL J·Filed 2011·Granted Apr 8, 2014·12 cites·18 claims
- 1287US6268639B1Electrostatic-discharge protection circuitXILINX INC·Filed 1999·Granted Jul 31, 2001·64 cites·22 claims
- 1386US9484919B1Selection of logic paths for redundancyXILINX INC·Filed 2014·Granted Nov 1, 2016·7 cites·20 claims
- 1486US9379109B1Integrated circuit having improved radiation immunityKARP JAMES·Filed 2012·Granted Jun 28, 2016·8 cites·14 claims
- 1586US7504854B1Regulating unused/inactive resources in programmable logic devices for static power reductionXILINX INC·Filed 2004·Granted Mar 17, 2009·29 cites·18 claims
- 1685US5108939AMethod of making a non-volatile memory cell utilizing polycrystalline silicon spacer tunnel regionNAT SEMICONDUCTOR CORP·Filed 1990·Granted Apr 28, 1992·68 cites·13 claims
- 1784US8982581B2Electro-static discharge protection for die of a multi-chip moduleKARP JAMES·Filed 2010·Granted Mar 17, 2015·9 cites·19 claims
- 1883US8519483B1Semiconductor device having a high resistance to ionizing radiationHART MICHAEL J·Filed 2011·Granted Aug 27, 2013·7 cites·13 claims
- 1983US6949951B1Integrated circuit multiplexer including transistors of more than one oxide thicknessXILINX INC·Filed 2004·Granted Sep 27, 2005·21 cites·54 claims
- 2083US6768335B1Integrated circuit multiplexer including transistors of more than one oxide thicknessXILINX INC·Filed 2003·Granted Jul 27, 2004·21 cites·46 claims
- 2182US8981491B1Memory array having improved radiation immunityHART MICHAEL J·Filed 2012·Granted Mar 17, 2015·6 cites·19 claims
- 2282US8410605B2Extended under-bump metal layer for blocking alpha particles in a semiconductor deviceHART MICHAEL J·Filed 2012·Granted Apr 2, 2013·5 cites·12 claims
- 2382US5726484AMultilayer amorphous silicon antifuseXILINX INC·Filed 1996·Granted Mar 10, 1998·61 cites·30 claims
- 2481US9793899B1Mitigation of single event latchupXILINX INC·Filed 2016·Granted Oct 17, 2017·5 cites·20 claims
- 2581US7544968B1Non-volatile memory cell with charge storage element and method of programmingXILINX INC·Filed 2005·Granted Jun 9, 2009·8 cites·13 claims
- 2681US6549458B1Non-volatile memory array using gate breakdown structuresXILINX INC·Filed 2001·Granted Apr 15, 2003·25 cites·23 claims
- 2780US7109734B2Characterizing circuit performance by separating device and interconnect impact on signal delayXILINX INC·Filed 2003·Granted Sep 19, 2006·18 cites·8 claims
- 2879US11177654B1Electro-static discharge (ESD) damage self-testXILINX INC·Filed 2018·Granted Nov 16, 2021·2 cites·20 claims
- 2979US10962588B1Integrated circuit devices and methods of designing and producing integrated circuitsXILINX INC·Filed 2018·Granted Mar 30, 2021·2 cites·20 claims
- 3079US8886481B1Reducing variation in multi-die integrated circuitsRAHMAN ARIFUR·Filed 2010·Granted Nov 11, 2014·4 cites·19 claims
- 3179US7089527B2Structures and methods for selectively applying a well bias to portions of a programmable deviceXILINX INC·Filed 2004·Granted Aug 8, 2006·15 cites·20 claims
- 3278US9825632B1Circuit for and method of preventing multi-bit upsets induced by single event transientsXILINX INC·Filed 2016·Granted Nov 21, 2017·3 cites·16 claims
- 3378US7793238B1Method and apparatus for improving a circuit layout using a hierarchical layout descriptionXILINX INC·Filed 2008·Granted Sep 7, 2010·10 cites·19 claims
- 3478US7489152B2Characterizing circuit performance by separating device and interconnect impact on signal delayXILINX INC·Filed 2006·Granted Feb 10, 2009·7 cites·8 claims
- 3578US6243294B1Memory architecture for non-volatile storage using gate breakdown structure in standard sub 0.35 micron processXILINX INC·Filed 2000·Granted Jun 5, 2001·25 cites·23 claims
- 3678US5970372AMethod of forming multilayer amorphous silicon antifuseXILINX INC·Filed 1997·Granted Oct 19, 1999·46 cites·11 claims
- 3777US10901097B1Method and apparatus for electronics-harmful-radiation (EHR) measurement and monitoringXILINX INC·Filed 2018·Granted Jan 26, 2021·1 cites·20 claims
- 3877US9628081B2Interconnect circuits having low threshold voltage P-channel transistors for a programmable integrated circuitXILINX INC·Filed 2014·Granted Apr 18, 2017·4 cites·19 claims
- 3977US9058853B2Integrated circuit having improved radiation immunityHART MICHAEL J·Filed 2012·Granted Jun 16, 2015·4 cites·12 claims
- 4077US6645802B1Method of forming a zener diodeXILINX INC·Filed 2001·Granted Nov 11, 2003·20 cites·6 claims
- 4177US5455790AHigh density EEPROM cell array which can selectively erase each byte of data in each row of the arrayNAT SEMICONDUCTOR CORP·Filed 1994·Granted Oct 3, 1995·29 cites·17 claims
- 4276US10033388B1Circuit for and method of enabling the selection of a circuitXILINX INC·Filed 2017·Granted Jul 24, 2018·4 cites·20 claims
- 4376US7724016B2Characterizing circuit performance by separating device and interconnect impact on signal delayXILINX INC·Filed 2009·Granted May 25, 2010·6 cites·9 claims
- 4476US6522582B1Non-volatile memory array using gate breakdown structuresXILINX INC·Filed 2000·Granted Feb 18, 2003·20 cites·39 claims
- 4575US7888771B1E-fuse with scalable filament linkXILINX INC·Filed 2007·Granted Feb 15, 2011·7 cites·20 claims
- 4673US9000529B1Reduction of single event upsets within a semiconductor integrated circuitXILINX INC·Filed 2012·Granted Apr 7, 2015·3 cites·18 claims
- 4772US12385791B2Rayleigh-Raman polychromatic laser guide starUNIV ARIZONA·Filed 2020·Granted Aug 12, 2025·1 cites·20 claims
- 4872US5293331AHigh density EEPROM cell with tunnel oxide stripeNAT SEMICONDUCTOR CORP·Filed 1992·Granted Mar 8, 1994·34 cites·16 claims
- 4971US8302064B1Method of product performance improvement by selective feature sizing of semiconductor devicesSADOUGHI SHARMIN·Filed 2009·Granted Oct 30, 2012·6 cites·16 claims
- 5071US6982451B1Single event upset in SRAM cells in FPGAs with high resistivity gate structuresXILINX INC·Filed 2003·Granted Jan 3, 2006·15 cites·12 claims
Showing the top 50 of 82 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →