Inventor · disambiguated record
Michael Hughes
Also filed as: HUGHES MICHAEL · HUGHES MICHAEL K · HUGHES MICHAEL KARL WILLIAM · MARAIS THOMAS A DES
4 granted patents·6 pending applications·12 citations·filing 1978–2024
69Inventor score
Files withHONEYWELL INT INC3HONEYWELL INC1HUGHES MICHAEL K1HUGHES MICHAEL KARL WILLIAM1JOSHI MAHENDRA L1
Top patents by PatentIndex Score
10 records- 0179US11441394B1Downhole geothermal power generation and storageJOSHI MAHENDRA L·Filed 2021·Granted Sep 13, 2022·4 cites·15 claims
- 0269US2025125378A1Flexible Dryer Control and Optimization for Battery Electrode ManufacturingHONEYWELL INT INC·Filed 2023·Application pending·0 cites
- 0369US2025149535A1Battery Electrode Manufacturing Advanced Calender Measurement and ControlHONEYWELL INT INC·Filed 2023·Application pending·0 cites
- 0465US2025314486A1Lithium-ion Battery Microwave Single Side Caliper and Conductivity MeasurementsHONEYWELL INT INC·Filed 2024·Application pending·0 cites
- 0563US2025058313A1Lateral flow assay device adapted for beverage testingKNONAP LLC·Filed 2024·Application pending·0 cites
- 0658US8953932B2Temperature control of liquids, in particular continuous flow heatingHUGHES MICHAEL KARL WILLIAM·Filed 2008·Granted Feb 10, 2015·3 cites·17 claims
- 0751US4182728APreservation of dicarboxylic acid chloridesPROCTER & GAMBLE·Filed 1978·Granted Jan 8, 1980·4 cites·14 claims
- 0850US8012375B2Temperature indicating paintROLLS ROYCE PLC·Filed 2007·Granted Sep 6, 2011·1 cites·19 claims
- 0938US2008158572A1System and method for measurement of thickness of thin filmsHONEYWELL INC·Filed 2006·Application pending·0 cites
- 1037US2008285007A1System and method for measurement of thickness of thin filmsHUGHES MICHAEL K·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →