Inventor · disambiguated record
Min-Wook Hwang
Also filed as: HWANG MIN-WOOK
3 granted patents·1 pending application·44 citations·filing 1997–2011
70Inventor score
Top patents by PatentIndex Score
4 records- 0189US7579233B2Method of fabricating semiconductor device for reducing parasitic capacitance between bit lines and semiconductor device fabricated therebySAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Aug 25, 2009·32 cites·20 claims
- 0267US8022455B2Method of fabricating semiconductor device for reducing parasitic capacitance between bit lines and semiconductor device fabricated therebySAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Sep 20, 2011·3 cites·12 claims
- 0345US2013221007A1Safety capJUNG SEO-HUI·Filed 2011·Application pending·0 cites
- 0439US5837595AMethods of forming field oxide isolation regions with reduced susceptibility to polysilicon residue defectsSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Nov 17, 1998·9 cites·10 claims
Join the waitlist — get patent alerts
Get an alert when Min-Wook Hwang files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →