Inventor · disambiguated record
Mitsushi Ikeda
Also filed as: IKEDA MITSUSHI
34 granted patents·3 pending applications·2,250 citations·filing 1983–2014
98Inventor score
Top patents by PatentIndex Score
37 records- 0197US5459596AActive matrix liquid crystal display with supplemental capacitor line which overlaps signal lineTOSHIBA KK·Filed 1993·Granted Oct 17, 1995·296 cites·6 claims
- 0296US5706064ALCD having an organic-inorganic hybrid glass functional layerTOSHIBA KK·Filed 1996·Granted Jan 6, 1998·247 cites·20 claims
- 0393US6323490B1X-ray semiconductor detectorTOSHIBA KK·Filed 1999·Granted Nov 27, 2001·187 cites·22 claims
- 0493US5821622ALiquid crystal display deviceTOSHIBA KK·Filed 1996·Granted Oct 13, 1998·132 cites·12 claims
- 0593US4905066AThin-film transistorTOSHIBA KK·Filed 1989·Granted Feb 27, 1990·124 cites·6 claims
- 0692US4621260AThin-film transistor circuitTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Nov 4, 1986·74 cites·10 claims
- 0790US5028551AElectrode interconnection material, semiconductor device using this material and driving circuit substrate for display deviceTOSHIBA KK·Filed 1990·Granted Jul 2, 1991·109 cites·5 claims
- 0889US6403965B1X-ray image detector systemTOSHIBA KK·Filed 2000·Granted Jun 11, 2002·52 cites·11 claims
- 0989US5428250ALine material, electronic device using the line material and liquid crystal displayTOSHIBA KK·Filed 1993·Granted Jun 27, 1995·102 cites·7 claims
- 1089US5187602ALiquid crystal display apparatusTOSHIBA KK·Filed 1991·Granted Feb 16, 1993·88 cites·14 claims
- 1188US7126128B2Flat panel x-ray detectorTOSHIBA KK·Filed 2005·Granted Oct 24, 2006·11 cites·19 claims
- 1285US6713748B1Image detection deviceTOSHIBA KK·Filed 1999·Granted Mar 30, 2004·68 cites·17 claims
- 1385US6078365AActive matrix liquid crystal panel having an active layer and an intervening layer formed of a common semiconductor filmTOSHIBA KK·Filed 1997·Granted Jun 20, 2000·64 cites·21 claims
- 1484US6849853B2X-ray flat panel detectorTOSHIBA KK·Filed 2002·Granted Feb 1, 2005·34 cites·29 claims
- 1584US5600461AActive matrix liquid crystal display deviceTOSHIBA KK·Filed 1995·Granted Feb 4, 1997·72 cites·8 claims
- 1684US4700458AMethod of manufacture thin film transistorTOKYO SHIBAURA ELECTRIC CO·Filed 1985·Granted Oct 20, 1987·48 cites·16 claims
- 1783US6507026B2Planar X-ray detectorTOSHIBA KK·Filed 2001·Granted Jan 14, 2003·36 cites·12 claims
- 1883US6185274B1Image detecting device and an X-ray imaging systemTOSHIBA KK·Filed 1999·Granted Feb 6, 2001·77 cites·19 claims
- 1978US6559449B2Planar X-ray detectorTOSHIBA KK·Filed 2001·Granted May 6, 2003·23 cites·22 claims
- 2078US5566007AReflection type liquid crystal display device capable of color displayTOSHIBA KK·Filed 1994·Granted Oct 15, 1996·50 cites·9 claims
- 2178US5296653ADevice having a multi-layered conductor structureTOSHIBA KK·Filed 1992·Granted Mar 22, 1994·54 cites·19 claims
- 2276US5170244AElectrode interconnection material, semiconductor device using this material and driving circuit substrate for display deviceTOSHIBA KK·Filed 1991·Granted Dec 8, 1992·54 cites·18 claims
- 2375US5913100AMo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin filmTOSHIBA KK·Filed 1994·Granted Jun 15, 1999·40 cites·8 claims
- 2472US5738948AElectrode-wiring material and electrode-wiring substrate using the sameTOSHIBA KK·Filed 1995·Granted Apr 14, 1998·33 cites·48 claims
- 2571US5264728ALine material, electronic device using the line material and liquid crystal displayTOSHIBA KK·Filed 1990·Granted Nov 23, 1993·41 cites·15 claims
- 2670US6044128AX-ray imaging apparatus and X-ray imaging analysis apparatusTOSHIBA KK·Filed 1998·Granted Mar 28, 2000·37 cites·10 claims
- 2768US4975760AElectrode interconnection material, semiconductor device using this material and driving circuit substrate for display deviceTOSHIBA KK·Filed 1989·Granted Dec 4, 1990·28 cites·6 claims
- 2866US7153589B1Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin filmTOSHIBA KK·Filed 1998·Granted Dec 26, 2006·18 cites·11 claims
- 2966US7115878B2Flat panel X-ray detectorTOSHIBA KK·Filed 2003·Granted Oct 3, 2006·11 cites·20 claims
- 3065US9589855B2Method for manufacturing X-ray flat panel detector and X-ray flat panel detector TFT array substrateTOSHIBA ELECTRON TUBES & DEVIC·Filed 2014·Granted Mar 7, 2017·1 cites·12 claims
- 3164US6200694B1Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin filmTOSHIBA KK·Filed 1998·Granted Mar 13, 2001·23 cites·12 claims
- 3263US6862338B2Imaging deviceTOSHIBA KK·Filed 2003·Granted Mar 1, 2005·5 cites·14 claims
- 3352US2006237647A1X-ray imaging deviceTOSHIBA KK·Filed 2006·Application pending·0 cites
- 3449US2007181816A1Anisotropic conductive film, x-ray flat panel detector, infrared flat panel detector and display deviceTOSHIBA KK·Filed 2007·Application pending·0 cites
- 3546US2002093581A1X-ray imaging deviceTOSHIBA KK·Filed 2001·Application pending·0 cites
- 3642US7282717B2X-ray detector and X-ray examination apparatus using itTOSHIBA KK·Filed 2003·Granted Oct 16, 2007·0 cites·34 claims
- 3739US5431773AMethod of manufacturing semiconductor deviceTOSHIBA KK·Filed 1992·Granted Jul 11, 1995·11 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →