Inventor · disambiguated record
Michiari Kawano
Also filed as: KAWANO MICHIARI
10 granted patents·197 citations·filing 1987–2010
91Inventor score
Top patents by PatentIndex Score
10 records- 0185US8507377B2Semiconductor device, method of manufacturing the same, and phase shift maskWATANABE KENICHI·Filed 2010·Granted Aug 13, 2013·7 cites·8 claims
- 0285US7129565B2Semiconductor device, method of manufacturing the same, and phase shift maskFUJITSU LTD·Filed 2003·Granted Oct 31, 2006·35 cites·25 claims
- 0385US6433381B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2001·Granted Aug 13, 2002·39 cites·11 claims
- 0481US4833519ASemiconductor device with a wiring layer having good step coverage for contact holesFUJITSU LTD·Filed 1987·Granted May 23, 1989·49 cites·8 claims
- 0580US7119439B2Semiconductor device and method for manufacturing the sameFUJITSU LTD·Filed 2003·Granted Oct 10, 2006·26 cites·26 claims
- 0670US7241676B2Semiconductor device and method for manufacturing the sameFUJITSU LTD·Filed 2004·Granted Jul 10, 2007·15 cites·10 claims
- 0769US7755169B2Semiconductor device, method of manufacturing the same, and phase shift maskFUJITSU SEMICONDUCTOR LTD·Filed 2009·Granted Jul 13, 2010·3 cites·3 claims
- 0860US7498659B2Semiconductor device, method of manufacturing the same, and phase shift maskFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Mar 3, 2009·1 cites·8 claims
- 0956US5661340ADynamic random access memory having a stacked fin capacitor with reduced fin thicknessFUJITSU LTD·Filed 1993·Granted Aug 26, 1997·18 cites·19 claims
- 1051US6794244B2Semiconductor device and method of manufacturing the sameFUJITSU LTD·Filed 2002·Granted Sep 21, 2004·4 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →