Inventor · disambiguated record
Mikihiro Kimura
Also filed as: KIMURA MIKIHIRO
14 granted patents·297 citations·filing 1988–1997
94Inventor score
Files withMITSUBISHI ELECTRIC CORP14
Top patents by PatentIndex Score
14 records- 0182US5420513ADielectric breakdown prediction and dielectric breakdown life-time prediction using iterative voltage step stressingMITSUBISHI ELECTRIC CORP·Filed 1993·Granted May 30, 1995·44 cites·4 claims
- 0282US5029321ASolid state image sensing device formed of charge coupled devicesMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Jul 2, 1991·41 cites·18 claims
- 0375US5594349ADielecrtric breakdown prediction apparatus and method, and dielectric breakdown life-time prediction apparatus and methodMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 14, 1997·34 cites·6 claims
- 0474US4933731ASuperlattice imaging deviceMITSUBISHI ELECTRIC CORP·Filed 1988·Granted Jun 12, 1990·29 cites·30 claims
- 0559US5051798ASolid state image sensing device having an overflow drain structureMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Sep 24, 1991·20 cites·9 claims
- 0658US5114865AMethod of manufacturing a solid-state image sensing device having an overflow drain structureMITSUBISHI ELECTRIC CORP·Filed 1991·Granted May 19, 1992·19 cites·3 claims
- 0756US5086010AMethod for manufacturing solid state image sensing device formed of charge coupled devices on side surfaces of trenchesMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Feb 4, 1992·18 cites·3 claims
- 0856US5032786AMethod of a measuring physical properties of buried channelMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Jul 16, 1991·15 cites·2 claims
- 0955US5621222ASuperlattice semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1989·Granted Apr 15, 1997·22 cites·1 claims
- 1053US5841164ATest structure for dielectric film evaluationMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Nov 24, 1998·19 cites·18 claims
- 1153US5786689AApparatus including a measurement time counting device for measuring an electrical characteristic of semiconductorMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jul 28, 1998·18 cites·8 claims
- 1244US5266892AMethod of measuring interface state density distribution in MIS structureMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Nov 30, 1993·11 cites·3 claims
- 1334US6040199ASemiconductor test structure for estimating defects at isolation edge and test method using the sameMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Mar 21, 2000·4 cites·4 claims
- 1433US5874772ASemiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Feb 23, 1999·3 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →