Inventor · disambiguated record
Michael L. Lovejoy
Also filed as: LOVEJOY MICHAEL L
10 granted patents·1 pending application·465 citations·filing 1996–2006
89Inventor score
Top patents by PatentIndex Score
11 records- 0196US6031454AWorker-specific exposure monitor and method for surveillance of workersSANDIA CORP·Filed 1997·Granted Feb 29, 2000·315 cites·20 claims
- 0288US6789220B1Method and apparatus for vector processingXILINX INC·Filed 2001·Granted Sep 7, 2004·41 cites·21 claims
- 0385US7436726B1Circuit for and method of reading data in an asynchronous FIFO including a backup address circuit for re-reading dataXILINX INC·Filed 2005·Granted Oct 14, 2008·16 cites·17 claims
- 0483US5684308ACMOS-compatible InP/InGaAs digital photoreceiverSANDIA CORP·Filed 1996·Granted Nov 4, 1997·81 cites·48 claims
- 0555US7717060B2Controlled electroless platingFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted May 18, 2010·1 cites·6 claims
- 0653US7052962B1Non-volatile memory cell and method of manufacturing a non-volatile memory cellXILINX INC·Filed 2004·Granted May 30, 2006·4 cites·19 claims
- 0748US6822254B1Non-volatile memory cellFiled 2003·Granted Nov 23, 2004·3 cites·30 claims
- 0847US7176133B2Controlled electroless platingFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Feb 13, 2007·3 cites·29 claims
- 0938US2007295357A1Removing metal using an oxidizing chemistryLOVEJOY MICHAEL L·Filed 2006·Application pending·0 cites
- 1036US6437605B1Dynamic sense amplifier for low-power applicationsXILINX INC·Filed 2001·Granted Aug 20, 2002·1 cites·19 claims
- 1134US7527976B2Processes for testing a region for an analyte and a process for forming an electronic deviceFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted May 5, 2009·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →