Inventor · disambiguated record
Michael Mctigue
Also filed as: MCTIGUE MICHAEL · MCTIGUE MICHAEL T · MCTIGUE MICHAEL THOMAS
19 granted patents·11 pending applications·412 citations·filing 2001–2023
94Inventor score
Files withAGILENT TECHNOLOGIES INC11KEYSIGHT TECHNOLOGIES INC9MCTIGUE MICHAEL T6CANNON JAMES E2JOHNSON KENNETH W1
Top patents by PatentIndex Score
30 records- 0197US7005868B2Apparatus and method for canceling DC errors and noise generated by ground shield current in a probeAGILENT TECHNOLOGIES INC·Filed 2004·Granted Feb 28, 2006·124 cites·6 claims
- 0296US6864694B2Voltage probeAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 8, 2005·104 cites·20 claims
- 0387US6704670B2Systems and methods for wideband active probing of devices and circuits in operationAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 9, 2004·37 cites·24 claims
- 0486US6828768B2Systems and methods for wideband differential probing of variably spaced probe pointsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Dec 7, 2004·36 cites·17 claims
- 0585US6856126B2Differential voltage probeAGILENT TECHNOLOGIES INC·Filed 2003·Granted Feb 15, 2005·46 cites·27 claims
- 0684US9316669B2Measurement probe providing different levels of amplification for signals of different magnitudeKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Apr 19, 2016·5 cites·21 claims
- 0781US12372551B2Voltage probe device with adjustable biasKEYSIGHT TECHNOLOGIES INC·Filed 2022·Granted Jul 29, 2025·1 cites·20 claims
- 0880US9459290B2Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveformsKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Oct 4, 2016·4 cites·20 claims
- 0979US9857392B2Single ended test probe having ground and signal tipsKEYSIGHT TECHNOLOGIES INC·Filed 2014·Granted Jan 2, 2018·4 cites·20 claims
- 1076US9797927B2Browser probeKEYSIGHT TECHNOLOGIES INC·Filed 2015·Granted Oct 24, 2017·4 cites·20 claims
- 1170US7102370B2Compliant micro-browser for a hand held probeAGILENT TECHNOLOGIES INC·Filed 2004·Granted Sep 5, 2006·16 cites·20 claims
- 1269US9423422B2Oscilloscope probe having output clamping circuitKEYSIGHT TECHNOLOGIES INC·Filed 2013·Granted Aug 23, 2016·2 cites·20 claims
- 1369US6831452B2Systems and methods for wideband single-end probing of variabily spaced probe pointsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Dec 14, 2004·14 cites·14 claims
- 1467US2025112437A1Bandwidth improvement of through-hole distributed feedback laserKEYSIGHT TECHNOLOGIES INC·Filed 2023·Application pending·0 cites
- 1564US11644488B2DC power rail probes and measurement methodsKEYSIGHT TECHNOLOGIES INC·Filed 2020·Granted May 9, 2023·0 cites·20 claims
- 1655US6704673B2System and method for improving linearity and reducing digitization artifacts in a data analysis systemAGILENT TECHNOLOGIES INC·Filed 2002·Granted Mar 9, 2004·8 cites·20 claims
- 1747US6931331B2Measurement interface optimized for both differential and single-ended inputsAGILENT TECHNOLOGIES INC·Filed 2003·Granted Aug 16, 2005·4 cites·15 claims
- 1846US6725172B2Systems and methods for tagging measurement valuesAGILENT TECHNOLOGIES INC·Filed 2002·Granted Apr 20, 2004·3 cites·52 claims
- 1942US2007063715A1High bandwidth probeCANNON JAMES E·Filed 2005·Application pending·0 cites
- 2041US10914756B2Miniature test probeKEYSIGHT TECHNOLOGIES INC·Filed 2018·Granted Feb 9, 2021·0 cites·17 claims
- 2141US2007063714A1High bandwidth probeMCTIGUE MICHAEL T·Filed 2005·Application pending·0 cites
- 2240US2005251352A1Measurement interface optimized for both differential and single-ended inputsMCTIGUE MICHAEL T·Filed 2005·Application pending·0 cites
- 2339US2013106401A1Oscilloscope probe comprising status indicatorJOHNSON KENNETH W·Filed 2011·Application pending·0 cites
- 2437US6806697B2Apparatus and method for canceling DC errors and noise generated by ground shield current in a probeAGILENT TECHNOLOGIES INC·Filed 2002·Granted Oct 19, 2004·0 cites·1 claims
- 2537US2007222468A1High bandwidth probe systemMCTIGUE MICHAEL T·Filed 2006·Application pending·0 cites
- 2637US2006061348A1High frequency oscilloscope probe with unitized probe tipsCANNON JAMES E·Filed 2004·Application pending·0 cites
- 2737US2006250744A1Micro gap method and ESD protection deviceMCTIGUE MICHAEL T·Filed 2005·Application pending·0 cites
- 2837US2007115010A1Connection accessory for micro-probingMCTIGUE MICHAEL T·Filed 2005·Application pending·0 cites
- 2936US2007057682A1Signal probe and probe assemblyMCTIGUE MICHAEL T·Filed 2005·Application pending·0 cites
- 3034US2003025485A1Two path wide-band probe using pole-zero cancellationFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →