Inventor · disambiguated record
Michio Nakajima
Also filed as: NAKAJIMA MICHIO
23 granted patents·1 pending application·503 citations·filing 1991–2010
96Inventor score
Files withMITSUBISHI ELECTRIC CORP7ICOM INC4IBM3MITSUBISHI ELEC SYS LSI DESIGN3HITACHI GLOBAL STORAGE TECH2
Top patents by PatentIndex Score
24 records- 0192US5999574ADigital filter system, carrier reproduction circuit using the digital filter system, and demodulation circuit using the carrier reproduction circuitICOM INC·Filed 1997·Granted Dec 7, 1999·148 cites·29 claims
- 0283US7457067B2Method of controlling a recording current, and magnetic disk deviceHITACHI GLOBAL STORAGE TECH·Filed 2005·Granted Nov 25, 2008·6 cites·17 claims
- 0381US6798598B2Method for controlling write current to a write head during data write on a hard diskIBM·Filed 2002·Granted Sep 28, 2004·15 cites·8 claims
- 0481US5754355ADisk drive apparatus and read error recovery method in a disk drive apparatusIBM·Filed 1996·Granted May 19, 1998·39 cites·15 claims
- 0580US5856934ADigital filter systemICOM INC·Filed 1997·Granted Jan 5, 1999·37 cites·10 claims
- 0678US7661187B2Manufacturing method for magnetic disk driveHITACHI GLOBAL STORAGE TECH·Filed 2005·Granted Feb 16, 2010·3 cites·16 claims
- 0778US6794909B1Output circuit of semiconductor device having adjustable driving capabilityRENESAS TECH CORP·Filed 2003·Granted Sep 21, 2004·25 cites·4 claims
- 0874US5353253ASemiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Oct 4, 1994·35 cites·17 claims
- 0971US5696643ADisk drive apparatus and read error recovery method in a disk drive apparatusIBM·Filed 1996·Granted Dec 9, 1997·24 cites·16 claims
- 1070US6545934B2Semiconductor memory device having configuration suited for high integrationMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 8, 2003·19 cites·10 claims
- 1167US6114866ASemiconductor device test board and method for evaluating semiconductor devicesMITSUBISHI ELECTRIC SYSTEMS LS·Filed 1998·Granted Sep 5, 2000·34 cites·4 claims
- 1261US5973953ASemiconductor memory device having improved bit line structureMITSUBISHI ELEC SYS LSI DESIGN·Filed 1998·Granted Oct 26, 1999·24 cites·10 claims
- 1360US6423815B1Layer insulating film for multilayer interconnection, resin used therefor and process for producing the sameSUMITOMO BAKELITE CO·Filed 2000·Granted Jul 23, 2002·13 cites·11 claims
- 1450US6611571B1Apparatus and method for demodulating an angle-modulated signalICOM INC·Filed 1999·Granted Aug 26, 2003·14 cites·18 claims
- 1550US6204356B1Polybenzoxazole resin and precursor thereofSUMITOMO BAKELITE CO·Filed 1999·Granted Mar 20, 2001·17 cites·2 claims
- 1648US6127694ASemiconductor wafer and method of manufacturing the same, and semiconductor device and test board of the sameMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Oct 3, 2000·12 cites·23 claims
- 1745US5926429ASemiconductor memory device and method of refreshing semiconductor memory deviceMITSUBISHI ELEC SYS LSI DESIGN·Filed 1998·Granted Jul 20, 1999·10 cites·8 claims
- 1841US6040614ASemiconductor integrated circuit including a capacitor and a fuse elementMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Mar 21, 2000·10 cites·5 claims
- 1940US5293346ASimplified serial selection circuit for serial access in semiconductor memory and operating method thereofMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Mar 8, 1994·7 cites·14 claims
- 2035US6345005B2Integrated circuit with efficient testing arrangementMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 5, 2002·2 cites·5 claims
- 2133US5349555ARedundancy circuitMITSUBISHI ELECTRIC CORP·Filed 1993·Granted Sep 20, 1994·3 cites·17 claims
- 2233US2012142879A1Composition for film formation, insulating film and semiconductor deviceNAKAJIMA MICHIO·Filed 2010·Application pending·0 cites
- 2332US6043522AField effect transistor array including doped two-cell isolation region for preventing latchupMITSUBISHI ELEC SYS LSI DESIGN·Filed 1998·Granted Mar 28, 2000·3 cites·4 claims
- 2432US5831488ADigital phase modulator formed with a fixed-point digital signal processorICOM INC·Filed 1996·Granted Nov 3, 1998·3 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →