Inventor · disambiguated record
Mitsuhiro Nakano
Also filed as: NAKANO MITSUHIRO
10 granted patents·106 citations·filing 1992–2012
87Inventor score
Top patents by PatentIndex Score
10 records- 0177US5329130ACharged particle beam exposure method and apparatusFUJITSU LTD·Filed 1992·Granted Jul 12, 1994·33 cites·12 claims
- 0272US5334846ACorrection of charged particle beam exposure deflection by detecting stage position and a position detection markFUJITSU LTD·Filed 1992·Granted Aug 2, 1994·25 cites·14 claims
- 0366US7696996B2Laser scanning microscope apparatusOLYMPUS CORP·Filed 2005·Granted Apr 13, 2010·4 cites·28 claims
- 0465US7982948B2Scanning microscope for 3-D imaging of a moving specimenOLYMPUS CORP·Filed 2008·Granted Jul 19, 2011·4 cites·3 claims
- 0563US5892237ACharged particle beam exposure method and apparatusFUJITSU LTD·Filed 1997·Granted Apr 6, 1999·28 cites·19 claims
- 0657US8222619B2Multi-column electron beam exposure apparatus and multi-column electron beam exposure methodYAMADA AKIO·Filed 2009·Granted Jul 17, 2012·0 cites·11 claims
- 0755US8792703B2Method for tracking cellsNAKANO MITSUHIRO·Filed 2012·Granted Jul 29, 2014·1 cites·5 claims
- 0853US5610406ACharged particle beam exposure method and apparatusFUJITSU LTD·Filed 1995·Granted Mar 11, 1997·11 cites·16 claims
- 0946US7983466B2Microscope apparatus and cell observation methodOLYMPUS CORP·Filed 2007·Granted Jul 19, 2011·0 cites·13 claims
- 1035US8994806B2Microscope apparatus chronologically storing different types of image informationNAKANO MITSUHIRO·Filed 2010·Granted Mar 31, 2015·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →