Inventor · disambiguated record
Mitsuo Okamoto
Also filed as: OKAMOTO MITSUO
21 granted patents·6 pending applications·189 citations·filing 1991–2024
93Inventor score
Files withFUJI ELECTRIC CO LTD9CANON MEDICAL SYSTEMS CORP4SHARP KK4NAT INST OF ADVANCED IND SCIEN3AIST2
Top patents by PatentIndex Score
27 records- 0183US5493155AElectric power supply systemSHARP KK·Filed 1994·Granted Feb 20, 1996·120 cites·11 claims
- 0282US8003991B2Silicon carbide MOS field effect transistor with built-in Schottky diode and method for fabrication thereofNAT INST OF ADVANCED IND SCIEN·Filed 2006·Granted Aug 23, 2011·10 cites·11 claims
- 0380US7728336B2Silicon carbide semiconductor device and method for producing the sameNAT INST OF ADVANCED IND SCIEN·Filed 2007·Granted Jun 1, 2010·7 cites·17 claims
- 0477US7880173B2Semiconductor device and method of manufacturing sameNAT INST OF ADVANCED IND SCIEN·Filed 2008·Granted Feb 1, 2011·7 cites·8 claims
- 0575US10600921B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Mar 24, 2020·2 cites·8 claims
- 0672US5181160ADriving circuit for inverter microwave ovenSHARP KK·Filed 1991·Granted Jan 19, 1993·33 cites·4 claims
- 0769US10096680B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Oct 9, 2018·1 cites·18 claims
- 0866US9923062B2Silicon carbide semiconductor device and method of manufacturing a silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Mar 20, 2018·1 cites·13 claims
- 0965US11959932B2Automatic analyzing apparatusCANON MEDICAL SYSTEMS CORP·Filed 2022·Granted Apr 16, 2024·0 cites·7 claims
- 1063US2025089356A1Semiconductor deviceAIST·Filed 2024·Application pending·0 cites
- 1159US2023067196A1Automatic analyzing apparatus and control method for automatic analyzing apparatusCANON MEDICAL SYSTEMS CORP·Filed 2022·Application pending·0 cites
- 1255US2024061000A1Automatic analyzing apparatus and automatic analyzing methodCANON MEDICAL SYSTEMS CORP·Filed 2023·Application pending·0 cites
- 1354US7439635B2Output suppressing method of a plurality of dispersed power sources and dispersed power source managing systemSHARP KK·Filed 2007·Granted Oct 21, 2008·2 cites·9 claims
- 1453US9490338B2Silicon carbide semiconductor apparatus and method of manufacturing sameNAT INST ADVANCED IND SCIENCE & TECH·Filed 2013·Granted Nov 8, 2016·0 cites·3 claims
- 1552US2024266351A1Semiconductor device and manufacturing method thereofAIST·Filed 2022·Application pending·0 cites
- 1649US2021318346A1Automated analyzing apparatusCANON MEDICAL SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 1748US10770548B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2019·Granted Sep 8, 2020·0 cites·7 claims
- 1846US10163637B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Dec 25, 2018·0 cites·12 claims
- 1946US7312539B2Output suppressing method of a plurality of dispersed power sources and dispersed power source managing systemSHARP KK·Filed 2003·Granted Dec 25, 2007·3 cites·4 claims
- 2044US9922822B2Silicon carbide semiconductor device and manufacturing method of silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Mar 20, 2018·0 cites·20 claims
- 2144US7256082B2Production method for semiconductor deviceSANYO ELECTRIC CO·Filed 2002·Granted Aug 14, 2007·2 cites·9 claims
- 2243US10249497B2Silicon carbide semiconductor device and method of manufacturing silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2017·Granted Apr 2, 2019·0 cites·5 claims
- 2343US8952391B2Silicon carbide semiconductor device and its manufacturing methodHARADA SHINSUKE·Filed 2003·Granted Feb 10, 2015·1 cites·8 claims
- 2441US2009134402A1Silicon carbide mos field-effect transistor and process for producing the sameNAT INST OF ADV IND SCIENCE &·Filed 2005·Application pending·0 cites
- 2540US9960040B2Manufacturing method of silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2015·Granted May 1, 2018·0 cites·7 claims
- 2639US10103059B2Method of manufacturing silicon carbide semiconductor device and silicon carbide semiconductor deviceFUJI ELECTRIC CO LTD·Filed 2016·Granted Oct 16, 2018·0 cites·16 claims
- 2735US8835933B2Recessed gate-type silicon carbide field effect transistor and method of producing sameNAGANO TAKAHIRO·Filed 2010·Granted Sep 16, 2014·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →