Inventor · disambiguated record
Minho Rim
Also filed as: RIM MINHO
1 granted patent·2 pending applications·1 citations·filing 2021–2024
15Inventor score
Files withSAMSUNG ELECTRONICS CO LTD3
Top patents by PatentIndex Score
3 records- 0179US11988495B2Through-focus image-based metrology device, operation method thereof, and computing device for executing the operationSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 21, 2024·1 cites·16 claims
- 0262US2025147096A1Substrate inspection apparatus and method of inspecting a substrate using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0360US2025123243A1Semiconductor substrate inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →