Inventor · disambiguated record
Min Ho Rim
Also filed as: RIM MIN HO
3 granted patents·3 pending applications·0 citations·filing 2014–2024
39Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
6 records- 0163US2025198941A1Defect inspection system and defect inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0258US2024219314A1Optical measurement apparatus, optical measurement method using the same, and method for manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0345US10527556B2Optical measuring method and apparatus, and method of manufacturing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jan 7, 2020·0 cites·17 claims
- 0443US9194816B2Method of detecting a defect of a substrate and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Nov 24, 2015·0 cites·7 claims
- 0541US2018106731A1Semiconductor device inspection apparatus and method of driving the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
- 0637US10281410B2Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted May 7, 2019·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →