Inventor · disambiguated record
Minhwan Seo
Also filed as: SEO MINHWAN
8 granted patents·4 pending applications·1 citations·filing 2020–2025
72Inventor score
Top patents by PatentIndex Score
12 records- 0177US11823961B2Substrate inspection system and method of manufacturing semiconductor device using substrate inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 21, 2023·1 cites·20 claims
- 0262US12313393B2Level sensor and substrate processing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted May 27, 2025·0 cites·20 claims
- 0361US12392835B2Method of estimating state of charge of batterySAMSUNG SDI CO LTD·Filed 2023·Granted Aug 19, 2025·0 cites·10 claims
- 0454US2025264324A1Semiconductor measurement system having monochromator and operating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0553US11946809B2Polarization measuring device and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Apr 2, 2024·0 cites·19 claims
- 0652US11898912B2Hyperspectral imaging (HSI) apparatus and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 0752US2024105524A1Optical device, die bonding system, and die bonding methodSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0852US2025052559A1Measuring parallelismSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0950US12366444B2Optical assembly for parallelism measurement, optical apparatus including the same, die bonding system and die bonding method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jul 22, 2025·0 cites·20 claims
- 1050US2025334393A1Semiconductor measuring device using beam displacerSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 1148US12387963B2Optical assembly for alignment inspection, optical apparatus including the same, die bonding system and die bonding method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 12, 2025·0 cites·19 claims
- 1248US11823927B2Wafer inspection apparatus and system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Nov 21, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →