Inventor · disambiguated record
Michael A. Shore
Also filed as: SHORE MICHAEL · SHORE MICHAEL A · SHORE MICHAEL AMIEL
73 granted patents·5 pending applications·1,454 citations·filing 1993–2024
99Inventor score
Files withMICRON TECHNOLOGY INC72SHORE MICHAEL A2LANE MICHAEL S1LODESTAR LICENSING GROUP LLC1MICRON SEMICONDUCTOR INC1
Top patents by PatentIndex Score
78 records- 0199US11257535B2Apparatuses and methods for managing row access countsMICRON TECHNOLOGY INC·Filed 2020·Granted Feb 22, 2022·28 cites·18 claims
- 0298US11011215B1Apparatus with an internal-operation management mechanismMICRON TECHNOLOGY INC·Filed 2019·Granted May 18, 2021·28 cites·21 claims
- 0398US10770127B2Apparatuses and methods for managing row access countsMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 8, 2020·51 cites·19 claims
- 0496US11798610B2Apparatuses and methods for controlling steal ratesMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 24, 2023·5 cites·20 claims
- 0596US11069393B2Apparatuses and methods for controlling steal ratesMICRON TECHNOLOGY INC·Filed 2019·Granted Jul 20, 2021·28 cites·20 claims
- 0696US10867675B2Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cellsMICRON TECHNOLOGY INC·Filed 2018·Granted Dec 15, 2020·10 cites·30 claims
- 0796US10157926B2Memory cells and memory arraysMICRON TECHNOLOGY INC·Filed 2017·Granted Dec 18, 2018·25 cites·18 claims
- 0896US6556497B2Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 29, 2003·79 cites·11 claims
- 0996US6365421B2Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·118 cites·41 claims
- 1095US5781483ADevice and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 14, 1998·68 cites·18 claims
- 1194US7164595B1Device and method for using dynamic cell plate sensing in a DRAM memory cellMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 16, 2007·22 cites·20 claims
- 1294US6194738B1Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 27, 2001·102 cites·51 claims
- 1393US6449203B1Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 10, 2002·55 cites·12 claims
- 1492US10153281B2Memory cells and memory arraysMICRON TECHNOLOGY INC·Filed 2017·Granted Dec 11, 2018·11 cites·5 claims
- 1592US7251173B2Combination column redundancy system for a memory arrayMICRON TECHNOLOGY INC·Filed 2005·Granted Jul 31, 2007·29 cites·57 claims
- 1690US5953266ADevice and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 14, 1999·42 cites·1 claims
- 1790US5895962AStructure and a method for storing information in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 20, 1999·69 cites·8 claims
- 1889US7593272B2Detection of row-to-row shorts and other row decode defects in memory devicesMICRON TECHNOLOGY INC·Filed 2007·Granted Sep 22, 2009·18 cites·21 claims
- 1989US7307896B2Detection of row-to-row shorts and other row decode defects in memory devicesMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 11, 2007·19 cites·31 claims
- 2089US6044029ADevice and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 28, 2000·39 cites·1 claims
- 2188US6190972B1Method for storing information in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 20, 2001·55 cites·14 claims
- 2287US5381368AHardware implemented row copy enable mode for DRAMS to create repetitive backgrounds for video images or DRAM testingMICRON SEMICONDUCTOR INC·Filed 1993·Granted Jan 10, 1995·61 cites·3 claims
- 2386US11094697B2Vertical two-transistor single capacitor memory cells and memory arraysMICRON TECHNOLOGY INC·Filed 2018·Granted Aug 17, 2021·4 cites·8 claims
- 2486US6459635B1Apparatus and method for increasing test flexibility of a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 1, 2002·33 cites·31 claims
- 2585US8964494B2memories and methods for repair in open digit memory architecturesMICRON TECHNOLOGY INC·Filed 2013·Granted Feb 24, 2015·7 cites·19 claims
- 2685US5966334ADevice and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 12, 1999·30 cites·3 claims
- 2785US5440517ADRAMs having on-chip row copy circuits for use in testing and video imaging and method for operating sameMICRON TECHNOLOGY INC·Filed 1994·Granted Aug 8, 1995·54 cites·7 claims
- 2884US6373761B1Method and apparatus for multiple row activation in memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 16, 2002·25 cites·22 claims
- 2984US6023432ADevice and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 8, 2000·27 cites·4 claims
- 3081US6538949B2Device and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 25, 2003·15 cites·25 claims
- 3179US6519201B2Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 11, 2003·26 cites·6 claims
- 3277US6122213ADevice and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 19, 2000·20 cites·2 claims
- 3376US7558102B2Device and method having a memory array storing each bit in multiple memory cellsMICRON TECHNOLOGY INC·Filed 2007·Granted Jul 7, 2009·4 cites·13 claims
- 3475US7684228B2Device and method for using dynamic cell plate sensing in a DRAM memory cellMICRON TECHNOLOGY INC·Filed 2007·Granted Mar 23, 2010·4 cites·17 claims
- 3575US6947346B2Reducing digit equilibrate current during self-refresh modeMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 20, 2005·17 cites·32 claims
- 3675US6285618B1Device and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 4, 2001·11 cites·27 claims
- 3774US6958945B2Device having a memory array storing each bit in multiple memory cellsMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 25, 2005·10 cites·97 claims
- 3873US6442094B2Device and method for repairing a memory array by storing each bit in multiple memory cells in the arrayMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 27, 2002·10 cites·25 claims
- 3973US6023434AMethod and apparatus for multiple row activation in memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 8, 2000·22 cites·8 claims
- 4072US6292421B1Method and apparatus for multiple row activation in memory devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 18, 2001·13 cites·27 claims
- 4171US10607994B2Vertical 2T-2C memory cells and memory arraysMICRON TECHNOLOGY INC·Filed 2018·Granted Mar 31, 2020·2 cites·9 claims
- 4271US6711093B1Reducing digit equilibrate current during self-refresh modeMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 23, 2004·15 cites·53 claims
- 4370US6141276AApparatus and method for increasing test flexibility of a memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 31, 2000·24 cites·43 claims
- 4470US2024282355A1Apparatuses, systems, and methods for controller directed targeted refresh operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 4569US2024062798A1Apparatuses and methods for controlling steal ratesLODESTAR LICENSING GROUP LLC·Filed 2023·Application pending·0 cites
- 4668US8429470B2Memory devices, testing systems and methodsSHORE MICHAEL A·Filed 2010·Granted Apr 23, 2013·3 cites·28 claims
- 4768US6925021B2Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMsMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 2, 2005·11 cites·7 claims
- 4868US6195762B1Circuit and method for masking a dormant memory cellMICRON TECHONOLOGY INC·Filed 1998·Granted Feb 27, 2001·21 cites·35 claims
- 4967US6701470B1Method for testing a memory device having different number of data pads than the testerMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 2, 2004·15 cites·23 claims
- 5066US6104650ASacrifice read test modeMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 15, 2000·18 cites·68 claims
Showing the top 50 of 78 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →