Inventor · disambiguated record
Minami Shouji
Also filed as: SHOUJI Minami
8 granted patents·3 pending applications·10 citations·filing 2015–2024
78Inventor score
Files withHITACHI HIGH TECH CORP11
Top patents by PatentIndex Score
11 records- 0189US11355308B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 7, 2022·2 cites·13 claims
- 0280US11328897B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2020·Granted May 10, 2022·1 cites·17 claims
- 0378US11393657B2Electron beam deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 19, 2022·2 cites·15 claims
- 0478US10134564B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 20, 2018·3 cites·15 claims
- 0575US9812288B2Sample holder with light emitting and transferring elements for a charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2015·Granted Nov 7, 2017·2 cites·18 claims
- 0674US2024363306A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 0770US11631568B2Device defect detection method using a charged particle beamHITACHI HIGH TECH CORP·Filed 2021·Granted Apr 18, 2023·0 cites·16 claims
- 0854US2022216032A1Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Application pending·0 cites
- 0953US12196802B2Semiconductor inspection device and method for inspecting semiconductor sampleHITACHI HIGH TECH CORP·Filed 2020·Granted Jan 14, 2025·0 cites·19 claims
- 1049US11869745B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Jan 9, 2024·0 cites·7 claims
- 1133US2021233740A1Charged Particle Microscope and Method of Imaging SampleHITACHI HIGH TECH CORP·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →