Inventor · disambiguated record
Michiya Takimoto
Also filed as: TAKIMOTO MICHIYA
3 granted patents·6 pending applications·0 citations·filing 2010–2016
40Inventor score
Top patents by PatentIndex Score
9 records- 0145US10120275B2Layout method of mask pattern, manufacturing method of a semiconductor device and exposure maskTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 6, 2018·0 cites·14 claims
- 0243US8440376B2Exposure determining method, method of manufacturing semiconductor device, and computer program productKOTANI TOSHIYA·Filed 2011·Granted May 14, 2013·0 cites·3 claims
- 0336US8266552B2Pattern generating method, method of manufacturing semiconductor device, and recording mediumTAGUCHI TAKAFUMI·Filed 2010·Granted Sep 11, 2012·0 cites·18 claims
- 0436US2010266960A1Method of manufacturing semiconductor device and exposure deviceMASHITA HIROMITSU·Filed 2010·Application pending·0 cites
- 0534US2011065030A1Mask pattern determining method, mask manufacturing method, and device manufacturing methodKOTANI TOSHIYA·Filed 2010·Application pending·0 cites
- 0632US2014240705A1Semiconductor device, reticle method for checking position misalignment and method for manufacturing position misalignment checking markTOSHIBA KK·Filed 2013·Application pending·0 cites
- 0731US2010216064A1Semiconductor-device manufacturing method, computer program product, and exposure-parameter creating methodTAKIMOTO MICHIYA·Filed 2010·Application pending·0 cites
- 0830US2011194751A1Pattern verification method, pattern generating method, device fabrication method, pattern verification program, and pattern verification systemTAKIMOTO MICHIYA·Filed 2011·Application pending·0 cites
- 0925US2013251906A1Recording medium, imprint method, and imprint apparatusTAKIMOTO MICHIYA·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →