Inventor · disambiguated record
Michinobu Tanioka
Also filed as: TANIOKA MICHINOBU
15 granted patents·4 pending applications·453 citations·filing 1995–2006
94Inventor score
Files withNEC CORP17
Top patents by PatentIndex Score
19 records- 0196US7218131B2Inspection probe, method for preparing the same, and method for inspecting elementsNEC CORP·Filed 2005·Granted May 15, 2007·44 cites·10 claims
- 0290US6078229ASurface acoustic wave device mounted with a resin film and method of making sameNEC CORP·Filed 1998·Granted Jun 20, 2000·135 cites·18 claims
- 0388US6906546B2Semiconductor device inspection apparatus and inspection methodNEC CORP·Filed 2003·Granted Jun 14, 2005·42 cites·12 claims
- 0482US7906846B2Semiconductor device for implementing signal transmission and/or power supply by means of the induction of a coilNEC CORP·Filed 2006·Granted Mar 15, 2011·8 cites·19 claims
- 0581US5784264AMCM (Multi Chip Module) carrier with external connection teminals BGA (Ball Grid Array) type matrix array formNEC CORP·Filed 1995·Granted Jul 21, 1998·69 cites·11 claims
- 0676US6078123AStructure and method for mounting a saw deviceNEC CORP·Filed 1998·Granted Jun 20, 2000·51 cites·12 claims
- 0773US7852101B2Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatusNEC CORP·Filed 2006·Granted Dec 14, 2010·7 cites·15 claims
- 0863US6426878B2Bare chip carrier utilizing a pressing memberNEC CORP·Filed 2001·Granted Jul 30, 2002·11 cites·46 claims
- 0963US6013953ASemiconductor device with improved connection reliabilityNEC CORP·Filed 1998·Granted Jan 11, 2000·28 cites·14 claims
- 1060US6667627B2Probe for inspecting semiconductor device and method of manufacturing the sameNEC CORP·Filed 2002·Granted Dec 23, 2003·7 cites·20 claims
- 1157US6486688B2Semiconductor device testing apparatus having a contact sheet and probe for testing high frequency characteristicsNEC CORP·Filed 2001·Granted Nov 26, 2002·8 cites·38 claims
- 1257US5668058AMethod of producing a flip chipNEC CORP·Filed 1995·Granted Sep 16, 1997·23 cites·24 claims
- 1354US6433410B2Semiconductor device tester and method of testing semiconductor deviceNEC CORP·Filed 2001·Granted Aug 13, 2002·6 cites·14 claims
- 1446US6396290B1Test carrier and method of mounting semiconductor device thereonNEC CORP·Filed 1999·Granted May 28, 2002·12 cites·24 claims
- 1543US7548082B2Inspection probeNEC CORP·Filed 2004·Granted Jun 16, 2009·2 cites·10 claims
- 1637US2003030455A1Test probe having a sheet bodyNEC CORP·Filed 2002·Application pending·0 cites
- 1734US2002053917A1Probe structure and method for manufacturing the sameNEC CORP·Filed 2001·Application pending·0 cites
- 1830US2001040464A1Electric contact device for testing semiconductor deviceFiled 1999·Application pending·0 cites
- 1922US2002057034A1Surface elastic wave device having bumps in a definite area on the device and method for manufacturing the sameFiled 1999·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →