Inventor · disambiguated record
Michael Trainer
Also filed as: TRAINER MICHAEL · TRAINER MICHAEL N
24 granted patents·13 pending applications·605 citations·filing 1985–2021
96Inventor score
Top patents by PatentIndex Score
37 records- 0198US7471393B2Methods and apparatus for determining the size and shape of particlesTRAINER MICHAEL·Filed 2005·Granted Dec 30, 2008·86 cites·8 claims
- 0297US10620105B2Methods and apparatus for determining characteristics of particles from scattered lightTRAINER MICHAEL·Filed 2016·Granted Apr 14, 2020·20 cites·36 claims
- 0396US9297737B2Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2014·Granted Mar 29, 2016·24 cites·25 claims
- 0495US8705040B2Methods and apparatus for determining particle characteristics by measuring scattered lightTRAINER MICHAEL·Filed 2010·Granted Apr 22, 2014·19 cites·17 claims
- 0593US8634072B2Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2010·Granted Jan 21, 2014·33 cites·38 claims
- 0692US5650571ALow power signal processing and measurement apparatusFiled 1995·Granted Jul 22, 1997·112 cites·17 claims
- 0790US5416580AMethods and apparatus for determining small particle size distribution utilizing multiple light beamsGEN SIGNAL CORP·Filed 1993·Granted May 16, 1995·88 cites·21 claims
- 0889US10955327B2Method and apparatus for determining particle characteristics utilizing a plurality of beam splitting functions and correction of scattered lightTRAINER MICHAEL·Filed 2019·Granted Mar 23, 2021·3 cites·20 claims
- 0984US10386283B2Methods and apparatus for determining particle characteristics by utilizing force on particlesTRAINER MICHAEL·Filed 2017·Granted Aug 20, 2019·4 cites·36 claims
- 1078US10113945B2Method and apparatus for combining measurements of particle characteristics using light scattering and optical imagingTRAINER MICHAEL·Filed 2018·Granted Oct 30, 2018·1 cites·6 claims
- 1176US5094532AMethod and apparatus for measuring small particle size distributionGEN SIGNAL CORP·Filed 1989·Granted Mar 10, 1992·38 cites·18 claims
- 1268US6104491ASystem for determining small particle size distribution in high particle concentrationsMICROTRAC INC·Filed 1998·Granted Aug 15, 2000·32 cites·8 claims
- 1365US11513047B2Methods and apparatus for determining characteristics of particles from scattered lightTRAINER MICHAEL·Filed 2020·Granted Nov 29, 2022·0 cites·6 claims
- 1461US5094526AIntegrated optical waveguide doppler velocimeterGEN SIGNAL CORP·Filed 1990·Granted Mar 10, 1992·20 cites·14 claims
- 1561US4648274APhotoelastic measuring transducer and accelerometer based thereonGEN SIGNAL CORP·Filed 1985·Granted Mar 10, 1987·21 cites·14 claims
- 1659US6177983B1Method and system for the measurement of specific characteristics of small particlesMICROTRAC INC·Filed 1998·Granted Jan 23, 2001·22 cites·10 claims
- 1757US2008204718A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 1857US2008204719A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 1957US2008204716A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 2057US2008204717A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 2157US2008208511A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 2256US2008221711A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 2355US2007242269A1Methods and apparatus for determining characteristics of particlesTRAINER MICHAEL·Filed 2006·Application pending·0 cites
- 2455US2021333189A1Apparatus and methods for improving the determination of particle characteristics from light scatteringTRAINER MICHAEL·Filed 2021·Application pending·0 cites
- 2554US6164817AFiber optic hygrometer apparatus and methodHONEYWELL INC·Filed 1998·Granted Dec 26, 2000·17 cites·16 claims
- 2653US6281973B1Optical detection system and method for determining particle size distribution in an oscillating flow fieldMICROTRAC INC·Filed 1999·Granted Aug 28, 2001·17 cites·9 claims
- 2753US6104490AMultiple pathlength sensor for determining small particle size distribution in high particle concentrationsMICROTRAC INC·Filed 1998·Granted Aug 15, 2000·17 cites·7 claims
- 2849US2014226158A1Methods and apparatus for determining particle characteristicsTRAINER MICHAEL·Filed 2014·Application pending·0 cites
- 2949US2008218738A1Methods and apparatus for determining particle characteristics by measuring scattered lightTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 3049US2006094109A1Device and method for analytical cell imagingIMMUNIVEST CORP·Filed 2004·Application pending·0 cites
- 3147US6396979B1Optical waveguide probe having variable gap focusingMICROTRAC INC·Filed 1999·Granted May 28, 2002·13 cites·24 claims
- 3247US6094266ADetector for determining particle size distribution in an oscillating flow fieldHONEYWELL INC·Filed 1999·Granted Jul 25, 2000·12 cites·25 claims
- 3345US8451434B2Method and apparatus for measuring zeta potential of suspended particlesFREUD PAUL J·Filed 2009·Granted May 28, 2013·0 cites·21 claims
- 3443US2008221814A1Methods and apparatus for determining particle characteristics by measuring scattered lightTRAINER MICHAEL·Filed 2007·Application pending·0 cites
- 3538US6084665AOptical sensor for detecting the dew point of an atmosphereHONEYWELL INT INC·Filed 1998·Granted Jul 4, 2000·6 cites·8 claims
- 3638US2007206203A1Methods and Apparatus for Determining Particle Characteristics by Measuring Scattered LightTRAINER MICHAEL·Filed 2005·Application pending·0 cites
- 3727US9897524B1Method and apparatus for measurement of particle characteristics using light scattering and optical imagingLAFOREST JASON·Filed 2017·Granted Feb 20, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →