Inventor · disambiguated record
Ming-Kai Tse
Also filed as: TSE MING · TSE MING K · TSE MING-KAI
6 granted patents·3 pending applications·44 citations·filing 1980–2005
80Inventor score
Files withQUALITY ENGINEERING ASSOCIATES3DOW CHEMICAL CO1MASSACHUSETTS INST TECHNOLOGY1QUALITY ENGINEERING INC1
Top patents by PatentIndex Score
9 records- 0162US4443764AMethod for non-destructive detection and characterization of flawsMASSACHUSETTS INST TECHNOLOGY·Filed 1980·Granted Apr 17, 1984·20 cites·15 claims
- 0251US6670814B2Semi-insulating material testing and optimizationQUALITY ENGINEERING ASSOCIATES·Filed 2002·Granted Dec 30, 2003·1 cites·3 claims
- 0342US4662228AAutomated interfacial testing systemDOW CHEMICAL CO·Filed 1985·Granted May 5, 1987·12 cites·20 claims
- 0438US2002048412A1System and method for interpolating a target image from a source imageFiled 2001·Application pending·0 cites
- 0535US2006034544A1Distinctness of image processingQUALITY ENGINEERING INC·Filed 2005·Application pending·0 cites
- 0634US5929640AAutomated stationary/portable test system for photoconductive drumsQUALITY ENGINEERING ASSOCIATES·Filed 1996·Granted Jul 27, 1999·6 cites·7 claims
- 0733US2004046874A1Miniaturized photosensing instrumentation systemFiled 2001·Application pending·0 cites
- 0832US6469513B1Automated stationary/portable test system for applying a current signal to a dielectric material being testedQUALITY ENGINEERING ASSOCIATES·Filed 1999·Granted Oct 22, 2002·5 cites·8 claims
- 0925USD461731SPalm based photosensor instrumentationFiled 2001·Granted Aug 20, 2002·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →