Inventor · disambiguated record
Mihir Tungare
Also filed as: Tungare Mihir
9 granted patents·38 citations·filing 2016–2022
80Inventor score
Top patents by PatentIndex Score
9 records- 0195US9608075B1III-nitride semiconductor device with doped epi structuresINFINEON TECHNOLOGIES AMERICAS CORP·Filed 2016·Granted Mar 28, 2017·37 cites·20 claims
- 0273US12080785B2Method of controlling wafer bow in a type III-V semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2022·Granted Sep 3, 2024·0 cites·11 claims
- 0367US11535952B2Wafer carrier and methodINFINEON TECHNOLOGIES AMERICAS CORP·Filed 2020·Granted Dec 27, 2022·0 cites·13 claims
- 0465US11387355B2Method of controlling wafer bow in a type III-V semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2020·Granted Jul 12, 2022·0 cites·9 claims
- 0562US10211329B2Charge trapping prevention III-Nitride transistorINFINEON TECHNOLOGIES AMERICAS CORP·Filed 2016·Granted Feb 19, 2019·1 cites·18 claims
- 0654US10720520B2Method of controlling wafer bow in a type III-V semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2017·Granted Jul 21, 2020·0 cites·3 claims
- 0751US10829866B2Wafer carrier and methodINFINEON TECHNOLOGIES AMERICAS CORP·Filed 2017·Granted Nov 10, 2020·0 cites·7 claims
- 0851US10411124B2Semiconductor component with protrusion propagation body and corresponding methods of manufactureINFINEON TECHNOLOGIES AMERICAS CORP·Filed 2018·Granted Sep 10, 2019·0 cites·18 claims
- 0947US9954089B2Low dislocation density III-nitride semiconductor componentINFINEON TECHNOLOGIES AMERICAS CORP·Filed 2016·Granted Apr 24, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →