Inventor · disambiguated record
Ming-Whang Wang
Also filed as: WANG MING · WANG MING-WHANG
10 granted patents·3 pending applications·13 citations·filing 2011–2019
81Inventor score
Files withDELTA ELECTRONICS INC13
Top patents by PatentIndex Score
13 records- 0177US8884657B2Switch-driving circuitDELTA ELECTRONICS INC·Filed 2013·Granted Nov 11, 2014·5 cites·7 claims
- 0273US10727664B2Temperature protection circuitDELTA ELECTRONICS INC·Filed 2019·Granted Jul 28, 2020·2 cites·20 claims
- 0371US11186191B2Charging device for electric vehicleDELTA ELECTRONICS INC·Filed 2019·Granted Nov 30, 2021·2 cites·10 claims
- 0466US9287863B2Switch driving circuitDELTA ELECTRONICS INC·Filed 2013·Granted Mar 15, 2016·3 cites·14 claims
- 0553US9192036B2Power apparatus for X-ray tube, power system with the power apparatus, and method of operating the sameDELTA ELECTRONICS INC·Filed 2013·Granted Nov 17, 2015·1 cites·20 claims
- 0647US10886912B2Gate circuit and gate drive circuit for power semiconductor switchDELTA ELECTRONICS INC·Filed 2019·Granted Jan 5, 2021·0 cites·20 claims
- 0740US10587258B2Drive circuit of power semiconductor switchDELTA ELECTRONICS INC·Filed 2019·Granted Mar 10, 2020·0 cites·17 claims
- 0840US2011253706A1Heating device with plural induction coilsDELTA ELECTRONICS INC·Filed 2011·Application pending·0 cites
- 0939US9722413B2Devices for ground-resistance detectionDELTA ELECTRONICS INC·Filed 2015·Granted Aug 1, 2017·0 cites·10 claims
- 1038US9853440B2Ground detecting apparatus and relay action detecting apparatusDELTA ELECTRONICS INC·Filed 2015·Granted Dec 26, 2017·0 cites·8 claims
- 1138US2015124932A1Power system of x-ray tube and method of controlling the sameDELTA ELECTRONICS INC·Filed 2014·Application pending·0 cites
- 1237US9991695B2Charging circuit interrupt devices with self-test and methods thereofDELTA ELECTRONICS INC·Filed 2015·Granted Jun 5, 2018·0 cites·18 claims
- 1336US2018034291A1Power plug apparatus and over temperature protection method thereofDELTA ELECTRONICS INC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →