Inventor · disambiguated record
Min Soo Yoo
Also filed as: YOO MIN SOO
21 granted patents·5 pending applications·67 citations·filing 2005–2024
93Inventor score
Top patents by PatentIndex Score
26 records- 0194US9356029B2Semiconductor device having buried gate, method of fabricating the same, and module and system having the sameSK HYNIX INC·Filed 2015·Granted May 31, 2016·9 cites·12 claims
- 0290US9064956B2Semiconductor device having buried gate, method of fabricating the same, and module and system having the sameSK HYNIX INC·Filed 2012·Granted Jun 23, 2015·8 cites·13 claims
- 0387US10964794B2Cryogenic semiconductor device having buried channel array transistorSK HYNIX INC·Filed 2019·Granted Mar 30, 2021·4 cites·20 claims
- 0486US7102187B2Gate structure of a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Sep 5, 2006·12 cites·4 claims
- 0583US9768176B2Semiconductor device and method for forming the sameSK HYNIX INC·Filed 2016·Granted Sep 19, 2017·3 cites·15 claims
- 0682US9455329B2Junctionless semiconductor device having buried gate, apparatus including the same, and method for manufacturing the semiconductor deviceSK HYNIX INC·Filed 2014·Granted Sep 27, 2016·5 cites·8 claims
- 0781US8004048B2Semiconductor device having a buried gate that can realize a reduction in gate-induced drain leakage (GIDL) and method for manufacturing the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 23, 2011·7 cites·8 claims
- 0881US7927962B2Semiconductor device having buried insulation films and method of manufacturing the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Apr 19, 2011·10 cites·20 claims
- 0969US9608106B2Semiconductor device and method for forming the sameSK HYNIX INC·Filed 2016·Granted Mar 28, 2017·1 cites·6 claims
- 1069US9368399B2Semiconductor device and method for forming the sameSK HYNIX INC·Filed 2014·Granted Jun 14, 2016·2 cites·10 claims
- 1169US8772105B2Semiconductor device and method for forming the sameJANG TAE SU·Filed 2011·Granted Jul 8, 2014·2 cites·19 claims
- 1265US8420484B2Semiconductor device having a buried gate that can realize a reduction in gate-induced drain leakage (GIDL) and method for manufacturing the sameYOO MIN SOO·Filed 2011·Granted Apr 16, 2013·2 cites·13 claims
- 1363US9177958B2Vertical semiconductor device, module and system each including the same, and method for manufacturing the vertical semiconductor deviceSK HYNIX INC·Filed 2014·Granted Nov 3, 2015·1 cites·17 claims
- 1463US8923035B2Junctionless semiconductor device having buried gate, apparatus including the same, and method for manufacturing the semiconductor deviceSK HYNIX INC·Filed 2012·Granted Dec 30, 2014·1 cites·10 claims
- 1557US9337308B2Semiconductor device and method for forming the sameSK HYNIX INC·Filed 2014·Granted May 10, 2016·0 cites·13 claims
- 1656US2025233027A1Method and apparatus for evaluating influence of process on semiconductor device performance and application thereofSK HYNIX INC·Filed 2024·Application pending·0 cites
- 1751US2016240538A1Semiconductor device having buried gate, method of fabricating the same, and module and system having the sameSK HYNIX INC·Filed 2016·Application pending·0 cites
- 1850US8878285B2Vertical semiconductor device, module and system each including the same, and method for manufacturing the vertical semiconductor deviceSK HYNIX INC·Filed 2012·Granted Nov 4, 2014·0 cites·19 claims
- 1950US2023414135A1Patch-type biosensorDONGWOO FINE CHEM CO LTD·Filed 2021·Application pending·0 cites
- 2049US9263448B2Semiconductor device with buried metal layerSK HYNIX INC·Filed 2013·Granted Feb 16, 2016·0 cites·20 claims
- 2147US9673107B2Semiconductor device with buried metal layerSK HYNIX INC·Filed 2016·Granted Jun 6, 2017·0 cites·15 claims
- 2247US7378307B2Gate of a semiconductor device and method for forming the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Granted May 27, 2008·0 cites·5 claims
- 2343US2017137610A1Conductive silicone resin composition and gasket for electromagnetic wave shielding manufactured from sameUKSEUNG CHEMICAL CO LTD·Filed 2015·Application pending·0 cites
- 2439US11887656B2Memory for improving efficiency of error correctionSK HYNIX INC·Filed 2021·Granted Jan 30, 2024·0 cites·6 claims
- 2539US9196618B2Semiconductor device and method of manufacturing the sameYOO MIN SOO·Filed 2011·Granted Nov 24, 2015·0 cites·14 claims
- 2638US2011180873A1Semiconductor device and method of manufacturing the sameHYNIX SEMICONDUCTOR INC·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →