Inventor · disambiguated record
Minoru Yoshida
Also filed as: INOUE HIROMASA · YOSHIDA MINORU
353 granted patents·54 pending applications·7,164 citations·filing 1975–2024
99Inventor score
Top patents by PatentIndex Score
407 records- 0198US6621571B1Method and apparatus for inspecting defects in a patterned specimenHITACHI LTD·Filed 2000·Granted Sep 16, 2003·149 cites·30 claims
- 0297US9892559B2Portable terminal device, and portable control deviceDIGITAL ELECTRONICS CORP·Filed 2015·Granted Feb 13, 2018·43 cites·2 claims
- 0397US7957660B2Image forming apparatus having fixing device that responds to request when using decolorable inkTOSHIBA KK·Filed 2010·Granted Jun 7, 2011·15 cites·19 claims
- 0497US6371218B1Impact-driven rotating deviceMATSUSHITA ELECTRIC WORKS LTD·Filed 2000·Granted Apr 16, 2002·101 cites·18 claims
- 0597US5774222AManufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 1995·Granted Jun 30, 1998·167 cites·38 claims
- 0696US8615177B2Image forming apparatusTOSHIBA KK·Filed 2013·Granted Dec 24, 2013·9 cites·10 claims
- 0796US8478151B2Image forming apparatusIGUCHI KEN·Filed 2010·Granted Jul 2, 2013·11 cites·11 claims
- 0896US6556290B2Defect inspection method and apparatus thereforHITACHI LTD·Filed 2001·Granted Apr 29, 2003·75 cites·38 claims
- 0996US5634111AComputer system including a device with a plurality of identifiersHITACHI LTD·Filed 1993·Granted May 27, 1997·175 cites·8 claims
- 1095US10031451B2Image forming apparatus having fixing device that responds to request when using decolorable inkTOSHIBA KK·Filed 2017·Granted Jul 24, 2018·4 cites·16 claims
- 1195US5677755AMethod and apparatus for pattern exposure, mask used therefor, and semiconductor integrated circuit produced by using themHITACHI LTD·Filed 1994·Granted Oct 14, 1997·147 cites·39 claims
- 1294US7274813B2Defect inspection method and apparatusHITACHI LTD·Filed 2005·Granted Sep 25, 2007·18 cites·24 claims
- 1394US6690469B1Method and apparatus for observing and inspecting defectsHITACHI LTD·Filed 1999·Granted Feb 10, 2004·98 cites·35 claims
- 1494US4982096AMulti-element radiation detectorHITACHI MEDICAL CORP·Filed 1989·Granted Jan 1, 1991·133 cites·28 claims
- 1593USD682753SRadiator grill for automobileYOSHIDA MINORU·Filed 2012·Granted May 21, 2013·58 cites·1 claims
- 1693US8107717B2Defect inspection method and apparatusMAEDA SHUNJI·Filed 2011·Granted Jan 31, 2012·14 cites·16 claims
- 1793US7969567B2Method and device for detecting shape of surface of mediumHITACHI HIGH TECH CORP·Filed 2009·Granted Jun 28, 2011·18 cites·13 claims
- 1893US7477863B2Image forming apparatus and image forming method with cleaner portionTOSHIBA KK·Filed 2007·Granted Jan 13, 2009·14 cites·18 claims
- 1993US6900888B2Method and apparatus for inspecting a pattern formed on a substrateHITACHI HIGH TECH CORP·Filed 2003·Granted May 31, 2005·38 cites·23 claims
- 2093US6404498B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspectedHITACHI LTD·Filed 2000·Granted Jun 11, 2002·38 cites·26 claims
- 2193US5619690AComputer system including a computer which requests an access to a logical address in a secondary storage system with specification of a local address in the secondary storage systemHITACHI LTD·Filed 1994·Granted Apr 8, 1997·191 cites·11 claims
- 2293US5239185AMethod and equipment for measuring absorptance of light scattering materials using plural wavelengths of lightHITACHI LTD·Filed 1992·Granted Aug 24, 1993·122 cites·14 claims
- 2392USD683285SRear bumper for automobileYOSHIDA MINORU·Filed 2012·Granted May 28, 2013·53 cites·1 claims
- 2492US6499075B2Computer system including a device with a plurality of identifiersHITACHI LTD·Filed 2001·Granted Dec 24, 2002·51 cites·21 claims
- 2592US6237285B1Plant cultivation matKYODO KY TEC CORP·Filed 1999·Granted May 29, 2001·70 cites·19 claims
- 2692US6079862AAutomatic tracking lighting equipment, lighting controller and tracking apparatusMATSUSHITA ELECTRIC WORKS LTD·Filed 1997·Granted Jun 27, 2000·242 cites·29 claims
- 2791US7359044B2Method and apparatus for inspecting pattern defectsHITACHI HIGH TECH CORP·Filed 2005·Granted Apr 15, 2008·17 cites·23 claims
- 2891US7332213B2Hardcoat film, antireflection film and equipment for displayTORAY INDUSTRIES·Filed 2004·Granted Feb 19, 2008·57 cites·16 claims
- 2991US6947587B1Defect inspection method and apparatusHITACHI LTD·Filed 1999·Granted Sep 20, 2005·88 cites·30 claims
- 3091US6775702B2Computer system including a device with a plurality of identifiersHITACHI LTD·Filed 2002·Granted Aug 10, 2004·44 cites·15 claims
- 3190US10673289B2Motor with stiffened stator core, manufacturing method thereof, and washing machine including the motorSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jun 2, 2020·13 cites·6 claims
- 3290US9925850B2Window panel support structureTOYOTA MOTOR CO LTD·Filed 2014·Granted Mar 27, 2018·18 cites·14 claims
- 3390USD683284SFront bumper for automobileYOSHIDA MINORU·Filed 2012·Granted May 28, 2013·45 cites·1 claims
- 3490US8422892B2Image forming apparatus, image forming method, and computer-readable recording medium having image forming program recorded thereinYOSHIDA MINORU·Filed 2010·Granted Apr 16, 2013·8 cites·20 claims
- 3590US6674890B2Defect inspection method and apparatus thereforHITACHI LTD·Filed 2000·Granted Jan 6, 2004·41 cites·10 claims
- 3690US6178690B1Plant cultivation mat and method for laying the sameKYODO KY TEC CORP·Filed 1999·Granted Jan 30, 2001·62 cites·9 claims
- 3790US6169282B1Defect inspection method and apparatus thereforHITACHI LTD·Filed 1998·Granted Jan 2, 2001·107 cites·32 claims
- 3890US6091075AAutomatic focus detection method, automatic focus detection apparatus, and inspection apparatusHITACHI LTD·Filed 1998·Granted Jul 18, 2000·99 cites·42 claims
- 3990US5767985ASystem employing facsimile units to transmit E-mail between information processors over public telephone linesFUJI XEROX CO LTD·Filed 1995·Granted Jun 16, 1998·168 cites·15 claims
- 4089US8018585B2Surface defect inspecting apparatus with defect detection optical system and defect-detected image processingHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 13, 2011·20 cites·15 claims
- 4189US7853188B2Image forming apparatus and image forming methodTOSHIBA KK·Filed 2007·Granted Dec 14, 2010·10 cites·12 claims
- 4289US7110105B2Method and apparatus for inspecting pattern defectsHITACHI LTD·Filed 2005·Granted Sep 19, 2006·10 cites·7 claims
- 4389US6263099B1Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspectedHITACHI LTD·Filed 1998·Granted Jul 17, 2001·56 cites·28 claims
- 4489US5761402AArray type disk system updating redundant data asynchronously with data accessHITACHI LTD·Filed 1994·Granted Jun 2, 1998·120 cites·38 claims
- 4589US4637767AThreaded fastenerTOPURA KK·Filed 1984·Granted Jan 20, 1987·76 cites·13 claims
- 4688US11440108B2Rotary cutting toolSUMITOMO ELECTRIC HARDMETAL CORP·Filed 2017·Granted Sep 13, 2022·2 cites·8 claims
- 4788US6927847B2Method and apparatus for inspecting pattern defectsHITACHI LTD·Filed 2002·Granted Aug 9, 2005·24 cites·28 claims
- 4888US5684565APattern detecting method, pattern detecting apparatus, projection exposing apparatus using the same and exposure systemHITACHI LTD·Filed 1994·Granted Nov 4, 1997·57 cites·33 claims
- 4988US4773196AFlooring panels for free cable layingKYODO DENKI·Filed 1987·Granted Sep 27, 1988·76 cites·21 claims
- 5087US10753031B2Washing machine motor and washing machine having sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 25, 2020·5 cites·18 claims
Showing the top 50 of 407 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →