Inventor · disambiguated record
Morihiko Hamada
Also filed as: HAMADA MORIHIKO
3 granted patents·1 pending application·34 citations·filing 2002–2003
70Inventor score
Files withFUJITSU LTD4
Top patents by PatentIndex Score
4 records- 0167US6765401B2Semiconductor testing apparatus for conducting conduction testsFUJITSU LTD·Filed 2003·Granted Jul 20, 2004·16 cites·15 claims
- 0259US7171592B2Self-testing circuit in semiconductor memory deviceFUJITSU LTD·Filed 2003·Granted Jan 30, 2007·13 cites·19 claims
- 0346US7256591B2Probe card, having cantilever-type probe and methodFUJITSU LTD·Filed 2002·Granted Aug 14, 2007·5 cites·17 claims
- 0429US2003098702A1Probe card and probe contact methodFUJITSU LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →