Inventor · disambiguated record
Mokuji Kageyama
Also filed as: KAGEYAMA MOKUJI
10 granted patents·4 pending applications·335 citations·filing 1989–2015
91Inventor score
Files withTOSHIBA KK14
Top patents by PatentIndex Score
14 records- 0191US4990459AImpurity measuring methodTOSHIBA KK·Filed 1989·Granted Feb 5, 1991·80 cites·6 claims
- 0286US5939770ASemiconductor device and its manufacturing methodTOSHIBA KK·Filed 1998·Granted Aug 17, 1999·75 cites·9 claims
- 0386US5271796AMethod and apparatus for detecting defect on semiconductor substrate surfaceTOSHIBA KK·Filed 1992·Granted Dec 21, 1993·83 cites·20 claims
- 0455US6274505B1Etching method, etching apparatus and analyzing methodTOSHIBA KK·Filed 1999·Granted Aug 14, 2001·19 cites·20 claims
- 0553US6037270AMethod of manufacturing semiconductor device and methods of processing, analyzing and manufacturing its substrateTOSHIBA KK·Filed 1995·Granted Mar 14, 2000·19 cites·23 claims
- 0649US5395446ASemiconductor treatment apparatusTOSHIBA KK·Filed 1993·Granted Mar 7, 1995·19 cites·14 claims
- 0748US6165872ASemiconductor device and its manufacturing methodTOSHIBA KK·Filed 1999·Granted Dec 26, 2000·12 cites·10 claims
- 0847US5148457ASystem for analyzing metal impurity on the surface of a single crystal semiconductor by using total reflection of x-rays fluorescenceTOSHIBA KK·Filed 1991·Granted Sep 15, 1992·14 cites·6 claims
- 0943US2015221593A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1038US5574307ASemiconductor device and method of producing the sameTOSHIBA KK·Filed 1994·Granted Nov 12, 1996·9 cites·16 claims
- 1134US2015263212A1Substrate for semiconductor devices, method of manufacturing substrate for semiconductor devices, and solid-state imaging deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 1233US5055413AMethod of measuring impurities in oxide films using a meltable sample collection stickTOSHIBA KK·Filed 1989·Granted Oct 8, 1991·5 cites·2 claims
- 1333US2016071726A1Method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
- 1430US2016027833A1Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →