Inventor · disambiguated record
Mototaka Ochi
Also filed as: OCHI MOTOTAKA
21 granted patents·17 pending applications·128 citations·filing 2004–2023
93Inventor score
Files withKOBE STEEL LTD23MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4GOTO HIROSHI2KAWAKAMI NOBUYUKI2KK KOBE SEIKO SHO(KOBE STEEL LTD )1
Top patents by PatentIndex Score
38 records- 0196US8482189B2Display deviceGOTO HIROSHI·Filed 2010·Granted Jul 9, 2013·30 cites·13 claims
- 0292US7285482B2Method for producing solid-state imaging deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Oct 23, 2007·31 cites·12 claims
- 0388US8535997B2Wiring structure, thin film transistor substrate, method for manufacturing thin film transistor substrate, and display deviceKAWAKAMI NOBUYUKI·Filed 2009·Granted Sep 17, 2013·21 cites·7 claims
- 0484US7329557B2Method of manufacturing solid-state imaging device with P-type diffusion layersMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Feb 12, 2008·8 cites·12 claims
- 0578US8384280B2Reflective electrode, display device, and method for producing display deviceKOBE STEEL LTD·Filed 2008·Granted Feb 26, 2013·5 cites·16 claims
- 0678US8163143B2Al-Ni-La-Si system Al-based alloy sputtering target and process for producing the sameTAKAGI KATSUTOSHI·Filed 2008·Granted Apr 24, 2012·4 cites·2 claims
- 0775US8786090B2Al alloy film for display device, display device, and sputtering targetGOTO HIROSHI·Filed 2007·Granted Jul 22, 2014·6 cites·26 claims
- 0872US8053083B2Layered structure and its manufacturing methodKOBE STEEL LTD·Filed 2008·Granted Nov 8, 2011·5 cites·20 claims
- 0971US8299614B2Interconnection structure, a thin film transistor substrate, and a manufacturing method thereof, as well as a display deviceKAWAKAMI NOBUYUKI·Filed 2009·Granted Oct 30, 2012·4 cites·20 claims
- 1070US9947429B2Ag alloy film for reflecting electrode or wiring electrode, reflecting electrode or wiring electrode, and Ag alloy sputtering targetKOBE STEEL LTD·Filed 2014·Granted Apr 17, 2018·2 cites·8 claims
- 1169US9845529B2Electrode and method for producing sameKOBE STEEL LTD·Filed 2014·Granted Dec 19, 2017·2 cites·15 claims
- 1267US10515787B2Oxide sintered body and sputtering target, and method for producing sameKOBELCO RES INSTITUTE INC·Filed 2014·Granted Dec 24, 2019·2 cites·19 claims
- 1363US11515429B2Thin film transistor including oxide semiconductor layerKOBE STEEL LTD·Filed 2019·Granted Nov 29, 2022·0 cites·10 claims
- 1463US9640556B2Thin film transistorKOBE STEEL LTD·Filed 2015·Granted May 2, 2017·1 cites·11 claims
- 1559US7030433B2Solid-state imaging device and method of manufacturing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Apr 18, 2006·7 cites·3 claims
- 1657US2025220976A1Oxide semiconductor film, thin film transistor, sputtering target, and oxide sintered bodyKOBE STEEL LTD·Filed 2023·Application pending·0 cites
- 1756US8431931B2Reflective anode and wiring film for organic EL display deviceTAUCHI YUUKI·Filed 2009·Granted Apr 30, 2013·0 cites·22 claims
- 1855US2016224151A1Electrode to be used in input device and method for producing sameKOBE STEEL LTD·Filed 2014·Application pending·0 cites
- 1954US2009242394A1Al-based alloy sputtering target and manufacturing method thereofKOBELCO RES INST INC·Filed 2009·Application pending·0 cites
- 2051US2011248272A1Organic el display device reflective anode and method for manufacturing the sameKOBE STEEL LTD·Filed 2009·Application pending·0 cites
- 2147US7550814B2Solid-state imaging devicePANASONIC CORP·Filed 2005·Granted Jun 23, 2009·0 cites·17 claims
- 2247US2017330643A1Ag alloy film for reflecting electrode or wiring electrode, reflecting electrode or wiring electrode, and ag alloy sputtering targetKOBE STEEL LTD·Filed 2017·Application pending·0 cites
- 2345US9660103B2Thin film transistor and method for manufacturing sameKOBE STEEL LTD·Filed 2014·Granted May 23, 2017·0 cites·19 claims
- 2443US2019064569A1Antistatic film and display input deviceKOBE STEEL LTD·Filed 2017·Application pending·0 cites
- 2543US2015295058A1Thin-film transistor and manufacturing method thereforKOBE STEEL LTD·Filed 2013·Application pending·0 cites
- 2643US2016117028A1Wiring film for touch panel sensors, and touch panel sensorKOBE STEEL LTD·Filed 2014·Application pending·0 cites
- 2743US2011008640A1Display device, process for producing the display device, and sputtering targetKOBE STEEL LTD·Filed 2009·Application pending·0 cites
- 2841US9780005B2Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin filmKOBE STEEL LTD·Filed 2015·Granted Oct 3, 2017·0 cites·14 claims
- 2941US2020295143A1Oxide semiconductor thin film, thin film transistor, and sputtering targetKOBE STEEL LTD·Filed 2018·Application pending·0 cites
- 3041US2009001373A1Electrode of aluminum-alloy film with low contact resistance, method for production thereof, and display unitKOBE STEEL LTD·Filed 2008·Application pending·0 cites
- 3140US10475711B2Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing qualityKOBE STEEL LTD·Filed 2017·Granted Nov 12, 2019·0 cites·9 claims
- 3240US2007087518A1Semiconductor device and method for producing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Application pending·0 cites
- 3340US2015318400A1Thin film transistor and manufacturing method thereforKOBE STEEL LTD·Filed 2013·Application pending·0 cites
- 3439US8217397B2Thin film transistor substrate and display deviceOCHI MOTOTAKA·Filed 2009·Granted Jul 10, 2012·0 cites·15 claims
- 3537US2019051758A1Thin film transistor comprising oxide semiconductor layerKOBE STEEL LTD·Filed 2017·Application pending·0 cites
- 3635US2019123207A1Thin film transistorKOBE STEEL LTD·Filed 2017·Application pending·0 cites
- 3733US2019067489A1Thin film transistorKOBE STEEL LTD·Filed 2017·Application pending·0 cites
- 3824US2017170029A1Thin film transistorKK KOBE SEIKO SHO(KOBE STEEL LTD )·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →