Inventor · disambiguated record
Motoyuki Watanabe
Also filed as: WATANABE MOTOYUKI
10 granted patents·95 citations·filing 1988–2010
88Inventor score
Top patents by PatentIndex Score
10 records- 0184US6897964B2Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing themHAMAMATSU PHOTONICS KK·Filed 2001·Granted May 24, 2005·34 cites·28 claims
- 0277US8885173B2Film thickness measurement device and film thickness measurement methodOHTSUKA KENICHI·Filed 2010·Granted Nov 11, 2014·6 cites·10 claims
- 0375US6768552B2Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing themHAMAMATSU PHOTONICS KK·Filed 2001·Granted Jul 27, 2004·20 cites·18 claims
- 0469US8462337B2Spectrometer, spectrometry, and spectrometry programWATANABE MOTOYUKI·Filed 2009·Granted Jun 11, 2013·4 cites·6 claims
- 0563US7400396B2Fluorescent correalated spectrometric analysis deviceHAMANATSU PHOTONICS K K·Filed 2004·Granted Jul 15, 2008·7 cites·9 claims
- 0663US6897953B2Method for measuring fluorescence, apparatus for measuring fluorescence and apparatus for evaluating sample using itHAMAMATSU PHOTONICS KK·Filed 2001·Granted May 24, 2005·5 cites·13 claims
- 0755US8649023B2Film thickness measurement device and measurement methodOHTSUKA KENICHI·Filed 2010·Granted Feb 11, 2014·1 cites·12 claims
- 0846US5017829AFraming cameraHAMAMATSU PHOTONICS KK·Filed 1989·Granted May 21, 1991·6 cites·5 claims
- 0937US5250795AFeeble light measuring deviceHAMAMATSU PHOTONICS KK·Filed 1992·Granted Oct 5, 1993·7 cites·17 claims
- 1034US4945224AOptical waveform observing apparatusHAMAMATSU PHOTONICS KK·Filed 1988·Granted Jul 31, 1990·5 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →