Inventor · disambiguated record
Murari Kejariwal
Also filed as: KEJARIWAL MURARI · KEJARIWAL MURARI L
13 granted patents·1 pending application·251 citations·filing 1991–2009
92Inventor score
Top patents by PatentIndex Score
14 records- 0193US6515540B1High order multi-path operational amplifier with output saturation recoveryCIRRUS LOGIC INC·Filed 2001·Granted Feb 4, 2003·73 cites·27 claims
- 0285US7262654B2Circuits and methods for minimizing chopping artifacts at the output of a chopper-stabilized operational amplifierCIRRUS LOGIC INC·Filed 2005·Granted Aug 28, 2007·18 cites·18 claims
- 0383US6466091B1High order multi-path operational amplifier with reduced input referred offsetCIRRUS LOGIC INC·Filed 2000·Granted Oct 15, 2002·39 cites·9 claims
- 0480US7643573B2Power management in a data acquisition systemCIRRUS LOGIC INC·Filed 2006·Granted Jan 5, 2010·14 cites·32 claims
- 0578US6307430B1Noise reduction technique in chopper stabilized amplifierCIRRUS LOGIC INC·Filed 2000·Granted Oct 23, 2001·28 cites·19 claims
- 0676US5343155AFault detection and location system for power transmission and distribution linesRES AND DEV I INC AT MONTANA S·Filed 1991·Granted Aug 30, 1994·47 cites·1 claims
- 0769US7639002B1Non-invasive, low pin count test circuits and methodsCIRRUS LOGIC INC·Filed 2006·Granted Dec 29, 2009·6 cites·14 claims
- 0863US7202746B1Multiple-stage operational amplifier and methods and systems utilizing the sameCIRRUS LOGIC INC·Filed 2004·Granted Apr 10, 2007·14 cites·21 claims
- 0956US6885211B1Internal node offset voltage test circuits and methodsCIRRUS LOGIC INC·Filed 2002·Granted Apr 26, 2005·7 cites·23 claims
- 1053US7808263B2Non-invasive, low pin count test circuits and methods utilizing emulated stress conditionsCIRRUS LOGIC INC·Filed 2009·Granted Oct 5, 2010·1 cites·10 claims
- 1152US7521951B1Non-invasive, low pin count test circuits and methods utilizing emulated stress conditionsCIRRUS LOGIC INC·Filed 2006·Granted Apr 21, 2009·1 cites·7 claims
- 1250US7994863B2Electronic system having common mode voltage range enhancementCIRRUS LOGIC INC·Filed 2008·Granted Aug 9, 2011·2 cites·27 claims
- 1339US6937046B1Non-invasive, low pin count test circuits and methodsCIRRUS LOGIC INC·Filed 2001·Granted Aug 30, 2005·1 cites·6 claims
- 1438US2004193977A1Non-invasive, low pin count test circuits and methods utilizing emulated stress conditionsCIRRUS LOGIC INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →