Inventor · disambiguated record
Murlidhar V. Kulkarni
Also filed as: KULKARNI MURLIDHAR V
5 granted patents·115 citations·filing 1981–1994
82Inventor score
Files withIBM5
Top patents by PatentIndex Score
5 records- 0175US4844616AInterferometric dimensional measurement and defect detection methodIBM·Filed 1988·Granted Jul 4, 1989·47 cites·6 claims
- 0273US4590574AMethod for determining oxygen and carbon in silicon semiconductor wafer having rough surfaceIBM·Filed 1983·Granted May 20, 1986·29 cites·10 claims
- 0361US5544775ALaser machined sliderIBM·Filed 1994·Granted Aug 13, 1996·12 cites·23 claims
- 0449US4432809AMethod for reducing oxygen precipitation in silicon wafersIBM·Filed 1981·Granted Feb 21, 1984·18 cites·12 claims
- 0542US4506158ADual mode spectrometer test stationIBM·Filed 1983·Granted Mar 19, 1985·9 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →