Inventor · disambiguated record
Munir-Ud-Din Naeem
Also filed as: NAEEM MUNIR-UD-DIN
7 granted patents·62 citations·filing 1997–2003
84Inventor score
Files withIBM7
Top patents by PatentIndex Score
7 records- 0165US6960523B2Method of reducing erosion of a nitride gate cap layer during reactive ion etch of nitride liner layer for bit line contact of DRAM deviceIBM·Filed 2003·Granted Nov 1, 2005·10 cites·15 claims
- 0249US6066566AHigh selectivity collar oxide etch processesIBM·Filed 1998·Granted May 23, 2000·12 cites·20 claims
- 0346US6130182ADielectric catalyst structuresIBM·Filed 1997·Granted Oct 10, 2000·15 cites·20 claims
- 0440US6177286B1Reducing metal voids during BEOL metallizationIBM·Filed 1998·Granted Jan 23, 2001·8 cites·14 claims
- 0537US6193832B1Method of making dielectric catalyst structuresIBM·Filed 1997·Granted Feb 27, 2001·10 cites·17 claims
- 0635US6197267B1Catalytic reactorIBM·Filed 1997·Granted Mar 6, 2001·5 cites·13 claims
- 0729US6177337B1Method of reducing metal voids in semiconductor device interconnectionIBM·Filed 1998·Granted Jan 23, 2001·2 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →