Inventor · disambiguated record
Munehiro Tada
Also filed as: TADA MUNEHIRO
57 granted patents·9 pending applications·204 citations·filing 2002–2020
98Inventor score
Top patents by PatentIndex Score
66 records- 0196US9406877B2Semiconductor device and method of manufacturing the sameTADA MUNEHIRO·Filed 2010·Granted Aug 2, 2016·23 cites·26 claims
- 0289US8766233B2Semiconductor device with variable resistance element and method for manufacturing the sameSAKOTSUBO YUKIHIRO·Filed 2010·Granted Jul 1, 2014·16 cites·8 claims
- 0388US8536629B2Semiconductor device and method for manufacturing the sameTADA MUNEHIRO·Filed 2010·Granted Sep 17, 2013·9 cites·35 claims
- 0488US8278763B2Semiconductor deviceTADA MUNEHIRO·Filed 2011·Granted Oct 2, 2012·7 cites·11 claims
- 0586US9245789B2Method for forming wiringNEC CORP·Filed 2013·Granted Jan 26, 2016·7 cites·10 claims
- 0685US9029825B2Semiconductor device and manufacturing method for semiconductor deviceTADA MUNEHIRO·Filed 2011·Granted May 12, 2015·8 cites·18 claims
- 0785US7622808B2Semiconductor device and having trench interconnectionNEC CORP·Filed 2005·Granted Nov 24, 2009·10 cites·5 claims
- 0883US9059028B2Semiconductor device and method for manufacturing sameTADA MUNEHIRO·Filed 2010·Granted Jun 16, 2015·5 cites·16 claims
- 0983US8586958B2Switching element and manufacturing method thereofSAKAMOTO TOSHITSUGU·Filed 2010·Granted Nov 19, 2013·9 cites·9 claims
- 1082US8796659B2Variable resistance element, semiconductor device including variable resistance element, and methods for manufacturing variable resistance element and semiconductor deviceTADA MUNEHIRO·Filed 2011·Granted Aug 5, 2014·2 cites·20 claims
- 1182US8004087B2Semiconductor device with dual damascene wirings and method for manufacturing sameNEC CORP·Filed 2005·Granted Aug 23, 2011·9 cites·10 claims
- 1281US8198730B2Semiconductor device and method of manufacturing the sameTAGAMI MASAYOSHI·Filed 2008·Granted Jun 12, 2012·9 cites·20 claims
- 1381US8043957B2Semiconductor device, method for manufacturing semiconductor device and apparatus for manufacturing semiconductorNEC CORP·Filed 2007·Granted Oct 25, 2011·6 cites·18 claims
- 1478US8946672B2Resistance changing element capable of operating at low voltage, semiconductor device, and method for forming resistance change elementTADA MUNEHIRO·Filed 2010·Granted Feb 3, 2015·3 cites·10 claims
- 1577US8816312B2Semiconductor deviceTADA MUNEHIRO·Filed 2011·Granted Aug 26, 2014·6 cites·20 claims
- 1676US10340451B2Switching element having overlapped wiring connections and method for fabricating semiconductor switching deviceNEC CORP·Filed 2014·Granted Jul 2, 2019·3 cites·14 claims
- 1776US9231207B2Method for forming resistance changing element capable of operating at low voltageNEC CORP·Filed 2014·Granted Jan 5, 2016·2 cites·9 claims
- 1876US7701060B2Wiring structure and method for manufacturing the sameNEC CORP·Filed 2004·Granted Apr 20, 2010·20 cites·18 claims
- 1974US7923384B2Formation method of porous insulating film, manufacturing apparatus of semiconductor device, manufacturing method of semiconductor device, and semiconductor deviceNEC CORP·Filed 2006·Granted Apr 12, 2011·4 cites·33 claims
- 2072US8592303B2Wiring structure and method for manufacturing the sameTADA MUNEHIRO·Filed 2010·Granted Nov 26, 2013·3 cites·7 claims
- 2172US8174122B2Semiconductor deviceAMANO MARI·Filed 2010·Granted May 8, 2012·3 cites·3 claims
- 2270US8872542B2Semiconductor device and semiconductor device control methodSAKIMURA NOBORU·Filed 2011·Granted Oct 28, 2014·3 cites·13 claims
- 2370US6972453B2Method of manufacturing a semiconductor device capable of etching a multi-layer of organic films at a high selectivityNEC CORP·Filed 2002·Granted Dec 6, 2005·14 cites·15 claims
- 2469US10312288B2Switching element, semiconductor device, and semiconductor device manufacturing methodNEC CORP·Filed 2016·Granted Jun 4, 2019·1 cites·10 claims
- 2568US10615339B2Variable resistance element and method for fabricating the variable resistance elementNEC CORP·Filed 2017·Granted Apr 7, 2020·1 cites·13 claims
- 2667US9754998B2Semiconductor device and operation method for sameNEC CORP·Filed 2015·Granted Sep 5, 2017·2 cites·17 claims
- 2765US10103329B2Switching element and method for manufacturing switching elementNEC CORP·Filed 2013·Granted Oct 16, 2018·1 cites·3 claims
- 2865US8188600B2Semiconductor device and method of fabricating the sameAMANO MARI·Filed 2005·Granted May 29, 2012·4 cites·16 claims
- 2964US8790785B2Method of forming a porous insulation filmYAMAMOTO HIRONORI·Filed 2007·Granted Jul 29, 2014·3 cites·20 claims
- 3064US7968434B2Method of forming of a semiconductor film, method of manufacture of a semiconductor device and a semiconductor deviceNEC CORP·Filed 2008·Granted Jun 28, 2011·1 cites·8 claims
- 3163US7867906B2Semiconductor device and method for manufacturing sameNEC CORP·Filed 2006·Granted Jan 11, 2011·2 cites·5 claims
- 3260US8715791B2Method for forming porous insulating film and semiconductor deviceTADA MUNEHIRO·Filed 2006·Granted May 6, 2014·1 cites·12 claims
- 3359US9508432B2Semiconductor device with variable resistance switch and programming method thereforNEC CORP·Filed 2013·Granted Nov 29, 2016·2 cites·16 claims
- 3457US9257390B2Semiconductor device with dual damascene wiringsRENESAS ELECTRONICS CORP·Filed 2014·Granted Feb 9, 2016·0 cites·20 claims
- 3555US9059082B2Semiconductor device and operation method for sameTADA MUNEHIRO·Filed 2011·Granted Jun 16, 2015·1 cites·20 claims
- 3654US9548115B2Variable resistance element, semiconductor device having variable resistance element, semiconductor device manufacturing method, and programming method using variable resistance elementTADA MUNEHIRO·Filed 2013·Granted Jan 17, 2017·1 cites·9 claims
- 3754US7999391B2Multilayered wiring structure, and method for manufacturing multilayered wiringNEC CORP·Filed 2007·Granted Aug 16, 2011·1 cites·22 claims
- 3853US8084294B2Method of fabricating organic silicon film, semiconductor device including the same, and method of fabricating the semiconductor deviceTADA MUNEHIRO·Filed 2006·Granted Dec 27, 2011·0 cites·4 claims
- 3952US9059402B2Resistance-variable element and method for manufacturing the sameTADA MUNEHIRO·Filed 2010·Granted Jun 16, 2015·1 cites·6 claims
- 4050US10957739B2Resistance variation element, semiconductor device, and manufacturing methodNEC CORP·Filed 2017·Granted Mar 23, 2021·0 cites·10 claims
- 4149US10797105B2Semiconductor device and method for producing semiconductor deviceNEC CORP·Filed 2017·Granted Oct 6, 2020·0 cites·14 claims
- 4249US8916466B2Method for manufacturing dual damascene wiring in semiconductor deviceAMANO MARI·Filed 2011·Granted Dec 23, 2014·0 cites·15 claims
- 4348US10256400B2Semiconductor device and method of manufacturing the sameTADA MUNEHIRO·Filed 2016·Granted Apr 9, 2019·0 cites·12 claims
- 4448US2009014887A1Method of producing multilayer interconnection and multilayer interconnection structureNEC CORP·Filed 2007·Application pending·0 cites
- 4548US2011266550A1Method of forming of a semiconductor film, method of manufacture of a semiconductor device and a semiconductor deviceUNIV STANFORD·Filed 2011·Application pending·0 cites
- 4647US10340452B2Variable resistance element, semiconductor device, and manufacturing method of semiconductor deviceNEC CORP·Filed 2016·Granted Jul 2, 2019·0 cites·17 claims
- 4747US10305034B2Variable resistance element and method for producing variable resistance elementNEC CORP·Filed 2016·Granted May 28, 2019·0 cites·10 claims
- 4846US10923534B2Rectifying element and switching element having the rectifying elementNEC CORP·Filed 2017·Granted Feb 16, 2021·0 cites·16 claims
- 4946US10249643B2Hard copied semiconductor device having a resistance-variable non-volatile elementNEC CORP·Filed 2015·Granted Apr 2, 2019·0 cites·9 claims
- 5046US7482694B2Semiconductor device and its manufacturing methodNEC COPORATION·Filed 2003·Granted Jan 27, 2009·1 cites·5 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →