Inventor · disambiguated record
Munehiro Yoshida
Also filed as: YOSHIDA MUNEHIRO
23 granted patents·4 pending applications·382 citations·filing 1990–2021
96Inventor score
Top patents by PatentIndex Score
27 records- 0188US11475963B2Semiconductor memory with data protection function and data protection method thereofPOWERCHIP SEMICONDUCTOR MFG CORP·Filed 2021·Granted Oct 18, 2022·2 cites·20 claims
- 0288US7427158B2Advanced thermal sensorTOSHIBA KK·Filed 2005·Granted Sep 23, 2008·24 cites·18 claims
- 0386US7102417B2Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuitIBM·Filed 2004·Granted Sep 5, 2006·41 cites·20 claims
- 0484US7079432B2Semiconductor storage device formed to optimize test technique and redundancy technologyTOSHIBA KK·Filed 2005·Granted Jul 18, 2006·13 cites·2 claims
- 0582US7535020B2Systems and methods for thermal sensingTOSHIBA KK·Filed 2005·Granted May 19, 2009·11 cites·11 claims
- 0682US6957378B2Semiconductor memory deviceTOSHIBA KK·Filed 2002·Granted Oct 18, 2005·39 cites·30 claims
- 0779US6646932B2Semiconductor memory device having redundancy systemTOKYO SHIBAURA ELECTRIC CO·Filed 2002·Granted Nov 11, 2003·24 cites·26 claims
- 0877US7789558B2Thermal sensing circuit using bandgap voltage reference generators without trimming circuitryTOSHIBA KK·Filed 2009·Granted Sep 7, 2010·8 cites·20 claims
- 0975US5231607ASemiconductor memory deviceTOSHIBA KK·Filed 1990·Granted Jul 27, 1993·36 cites·15 claims
- 1068US6356507B1Synchronous DRAM using column operation sychronous pulses which are different between read and writeTOSHIBA KK·Filed 2000·Granted Mar 12, 2002·19 cites·18 claims
- 1168US6016265AFuse-latch circuit having high integration densityTOSHIBA KK·Filed 1998·Granted Jan 18, 2000·33 cites·13 claims
- 1265US7524108B2Thermal sensing circuits using bandgap voltage reference generators without trimming circuitryTOSHIBA AMERICAN ELECTRONIC CO·Filed 2003·Granted Apr 28, 2009·15 cites·19 claims
- 1365US6856561B2Semiconductor memory deviceTOSHIBA KK·Filed 2003·Granted Feb 15, 2005·12 cites·26 claims
- 1465US6570801B2Semiconductor memory having refresh functionTOSHIBA KK·Filed 2001·Granted May 27, 2003·14 cites·28 claims
- 1565US5367487ASemiconductor memory deviceTOSHIBA KK·Filed 1993·Granted Nov 22, 1994·25 cites·17 claims
- 1661US7187053B2Thermal sensing method and systemIBM·Filed 2003·Granted Mar 6, 2007·8 cites·16 claims
- 1759US6876588B2Semiconductor storage device formed to optimize test technique and redundancy technologyTOSHIBA KK·Filed 2003·Granted Apr 5, 2005·8 cites·2 claims
- 1858US2013183651A1Server, learning terminal apparatus, and learning content managing methodSONY CORP·Filed 2012·Application pending·0 cites
- 1957US5561630AData sense circuit for dynamic random access memoriesIBM·Filed 1995·Granted Oct 1, 1996·20 cites·19 claims
- 2056US6301144B1Semiconductor memory deviceTOSHIBA KK·Filed 2000·Granted Oct 9, 2001·9 cites·18 claims
- 2148US11078830B2Multi-stage turbochargerIHI CORP·Filed 2019·Granted Aug 3, 2021·0 cites·6 claims
- 2241US2018238190A1Nozzle drive mechanism and turbochargerIHI CORP·Filed 2018·Application pending·0 cites
- 2340US2007150225A1Thermal sensing method and systemBOERSTLER DAVID W·Filed 2007·Application pending·0 cites
- 2440US2006192597A1Temperature sensing circuits, and temperature detection circuits including sameJOHNS CHARLES R·Filed 2005·Application pending·0 cites
- 2537US5110750ASemiconductor device and method of making the sameTOSHIBA KK·Filed 1990·Granted May 5, 1992·6 cites·12 claims
- 2634US5964876AProgram-invocation-count measuring system, program-invocation-count measuring method, and medium for storing program-invocation-count measuring softwareMITSUBISHI ELEC SEMICONDUCTOR·Filed 1997·Granted Oct 12, 1999·11 cites·9 claims
- 2731US6063131AEmulator system and emulation methodMITSUBISHI ELECTRIC CORP·Filed 1997·Granted May 16, 2000·4 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →