Inventor · disambiguated record
Myoungki Ahn
Also filed as: AHN MYOUNGKI
2 granted patents·3 citations·filing 2020–2020
37Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0188US11972960B2Imaging ellipsometry (IE)-based inspection method and method of fabricating semiconductor device by using IE-based inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 30, 2024·3 cites·17 claims
- 0250US11624699B2Measurement system capable of adjusting AOI, AOI spread and azimuth of incident lightSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 11, 2023·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →