Inventor · disambiguated record
Myeong-Cheol Kim
Also filed as: KIM MYEONG-CHEOL
87 granted patents·13 pending applications·864 citations·filing 2000–2023
99Inventor score
Top patents by PatentIndex Score
100 records- 0197US9508727B2Integrated circuit device and method of manufacturing the samePARK HONG-BAE·Filed 2015·Granted Nov 29, 2016·48 cites·23 claims
- 0296US8987836B2Field effect transistor having fin base and at lease one fin protruding from fin baseSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Mar 24, 2015·40 cites·19 claims
- 0396US8916460B1Semiconductor device and method for fabricating the sameKWON BYOUNG-HO·Filed 2014·Granted Dec 23, 2014·74 cites·8 claims
- 0496US8247291B2Methods of forming fine patterns in integrated circuit devices and methods of manufacturing integrated circuit devices including the sameMIN JAE-HO·Filed 2011·Granted Aug 21, 2012·43 cites·17 claims
- 0595US10014304B2Integrated circuit device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 3, 2018·10 cites·16 claims
- 0694US9741854B2Method for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 22, 2017·16 cites·20 claims
- 0794US8629052B2Methods of forming semiconductor devices having narrow conductive line patternsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Jan 14, 2014·16 cites·13 claims
- 0894US7580388B2Method and apparatus for providing enhanced messages on common control channel in wireless communication systemLG ELECTRONICS INC·Filed 2005·Granted Aug 25, 2009·28 cites·65 claims
- 0994US7550391B2Method for forming fine patterns of a semiconductor device using double patterningSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Jun 23, 2009·30 cites·46 claims
- 1093US8110506B2Methods of forming fine patterns in semiconductor devicesMIN JAE-HO·Filed 2009·Granted Feb 7, 2012·18 cites·16 claims
- 1193US7576010B2Method of forming pattern using fine pitch hard maskSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 18, 2009·19 cites·28 claims
- 1292US9627542B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Apr 18, 2017·6 cites·20 claims
- 1392US8916936B2Transistor structure of a semiconductor deviceLEE JUNG-CHAN·Filed 2013·Granted Dec 23, 2014·15 cites·12 claims
- 1492US8906757B2Methods of forming patterns of a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Dec 9, 2014·13 cites·20 claims
- 1592US7535882B2Reception in dedicated service of wireless communication systemLG ELECTRONICS INC·Filed 2005·Granted May 19, 2009·27 cites·27 claims
- 1691US6385020B1Methods of forming HSG capacitors from nonuniformly doped amorphous silicon layers and HSG capacitors formed therebySAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted May 7, 2002·69 cites·15 claims
- 1790US11050683B2System for providing dialog contentSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jun 29, 2021·11 cites·20 claims
- 1890US8592265B2Method for manufacturing semiconductor device having a metal gate electrodeKIM DONG-KWON·Filed 2011·Granted Nov 26, 2013·14 cites·15 claims
- 1990US7601647B2Method of forming fine patterns of semiconductor device using double patterningSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 13, 2009·17 cites·20 claims
- 2089US8735248B2Method of manufacturing semiconductor deviceLEE JIN-WOOK·Filed 2012·Granted May 27, 2014·11 cites·18 claims
- 2189US7602802B2Interrupting use of frequency layer convergence schemeLG ELECTRONICS INC·Filed 2008·Granted Oct 13, 2009·12 cites·19 claims
- 2289US7394778B2Mapping of point of multipoint service identificationsLG ELECTRONICS INC·Filed 2005·Granted Jul 1, 2008·19 cites·22 claims
- 2388US8310055B2Semiconductor devices having narrow conductive line patterns and related methods of forming such semiconductor devicesPARK YOUNG-JU·Filed 2009·Granted Nov 13, 2012·15 cites·20 claims
- 2487US12261087B2Methods of manufacturing semiconductor devices by etching active fins using etching masks and forming source/drain layers on the active finsSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Mar 25, 2025·0 cites·19 claims
- 2587US7852803B2Enhanced radio link control error handlingLG ELECTRONICS INC·Filed 2006·Granted Dec 14, 2010·15 cites·10 claims
- 2686US9299811B2Methods of fabricating semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 29, 2016·7 cites·12 claims
- 2786US9190407B2Semiconductor device and method for fabricating the sameKWON BYOUNG-HO·Filed 2014·Granted Nov 17, 2015·5 cites·19 claims
- 2886US8254299B2Multimedia broadcast/multicast service cells reconfigurationsKIM MYEONG-CHEOL·Filed 2006·Granted Aug 28, 2012·16 cites·22 claims
- 2985US8637407B2Methods of forming fine patterns in semiconductor devicesMIN JAE-HO·Filed 2011·Granted Jan 28, 2014·5 cites·10 claims
- 3085US7998357B2Method of fine patterning semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 16, 2011·10 cites·25 claims
- 3185US7860087B2Distinguishing between protocol packets in a wireless communication systemLG ELECTRONICS INC·Filed 2005·Granted Dec 28, 2010·12 cites·28 claims
- 3284US10615080B2Methods of manufacturing semiconductor devices by etching active fins using etching masksSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 7, 2020·2 cites·7 claims
- 3384US9401359B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jul 26, 2016·6 cites·20 claims
- 3484US8900944B2Methods of manufacturing a semiconductor deviceJEONG SOO-YEON·Filed 2011·Granted Dec 2, 2014·8 cites·20 claims
- 3583US7715344B2Method and apparatus for providing enhanced messages on common control channel in wireless communicaton systemLG ELECTRONICS INC·Filed 2009·Granted May 11, 2010·7 cites·18 claims
- 3682US9048192B2Method of forming a patternKIM DONG-KWON·Filed 2012·Granted Jun 2, 2015·4 cites·20 claims
- 3782US6573602B2Semiconductor device with a self-aligned contact and a method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 3, 2003·30 cites·14 claims
- 3881US10651179B2Integrated circuit device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted May 12, 2020·2 cites·15 claims
- 3981US9070448B2Methods of forming fine patterns in semiconductor devicesMIN JAE-HO·Filed 2014·Granted Jun 30, 2015·4 cites·20 claims
- 4081US8846541B2Methods of forming fine patterns in semiconductor devicesSAMSUNG ELECTRONINCS CO LTD·Filed 2013·Granted Sep 30, 2014·5 cites·20 claims
- 4181US7596380B2Changing serving radio network controller for mobile terminal supporting multimedia broadcast servicesLG ELECTRONICS INC·Filed 2005·Granted Sep 29, 2009·9 cites·14 claims
- 4280US11830775B2Methods of manufacturing semiconductor devices by etching active fins using etching masksSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 28, 2023·0 cites·10 claims
- 4378US7660281B2Method and apparatus for providing enhanced messages on common control channel in wireless communication systemLG ELECTRONICS INC·Filed 2009·Granted Feb 9, 2010·5 cites·18 claims
- 4478US7512145B2Interrupting use of frequency layer convergence schemeLG ELECTRONICS INC·Filed 2005·Granted Mar 31, 2009·5 cites·54 claims
- 4578US6573551B1Semiconductor memory device having self-aligned contact and fabricating method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jun 3, 2003·23 cites·10 claims
- 4676US12512836B2Electronic device for overvoltage protectionSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Dec 30, 2025·0 cites·14 claims
- 4776US7998874B2Method for forming hard mask patterns having a fine pitch and method for forming a semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Aug 16, 2011·5 cites·12 claims
- 4875US7132708B2Semiconductor memory device having self-aligned contacts and method of fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Nov 7, 2006·6 cites·4 claims
- 4974US9379107B2FinFET semiconductor devices including dummy structuresLEE BOK-YOUNG·Filed 2015·Granted Jun 28, 2016·2 cites·19 claims
- 5073US8014376B2Managing channel configuration information in a wireless communication systemLG ELECTRONICS INC·Filed 2006·Granted Sep 6, 2011·4 cites·14 claims
Showing the top 50 of 100 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →