Inventor · disambiguated record
Myoung-Soo Lee
Also filed as: LEE MYOUNG SOO
18 granted patents·4 pending applications·69 citations·filing 2001–2018
92Inventor score
Top patents by PatentIndex Score
22 records- 0189US10120224B2Curved cover for curved display and curved type display apparatus including the sameLG DISPLAY CO LTD·Filed 2017·Granted Nov 6, 2018·10 cites·11 claims
- 0284US9817261B2Curved cover for curved display and curved type display apparatus including the sameLG DISPLAY CO LTD·Filed 2015·Granted Nov 14, 2017·5 cites·13 claims
- 0381US6631224B2Tunable filter with core mode blockerNOVERA OPTICS INC·Filed 2001·Granted Oct 7, 2003·24 cites·69 claims
- 0479US7763397B2Photomask registration errors of which have been corrected and method of correcting registration errors of photomaskSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 27, 2010·5 cites·34 claims
- 0573US7935552B2Ink composition and method of fabricating liquid crystal display device using the sameLG DISPLAY CO LTD·Filed 2009·Granted May 3, 2011·3 cites·2 claims
- 0672US8137870B2Method of manufacturing photomaskLEE MYOUNG-SOO·Filed 2009·Granted Mar 20, 2012·6 cites·19 claims
- 0770US9583728B2Organic light emitting deviceLG DISPLAY CO LTD·Filed 2015·Granted Feb 28, 2017·1 cites·12 claims
- 0865US7247412B2Method of correcting deviations of critical dimensions of patterns formed on a wafer in a EUVL processSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jul 24, 2007·8 cites·22 claims
- 0964US8936898B2Photosensitive resin composition for imprinting process and method for forming organic layer over substrateNAM YEON HEUI·Filed 2009·Granted Jan 20, 2015·3 cites·9 claims
- 1062US7630079B2Equipment and method for measuring transmittance of photomask under off axis illuminationSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 8, 2009·1 cites·21 claims
- 1161US8213722B2Method for inspecting critical dimension uniformity at high speed measurementKIM HEE-BOM·Filed 2009·Granted Jul 3, 2012·2 cites·10 claims
- 1261US8007963B2PhotomaskSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Aug 30, 2011·1 cites·20 claims
- 1360US9252385B2Organic light emitting deviceLG DISPLAY CO LTD·Filed 2014·Granted Feb 2, 2016·0 cites·6 claims
- 1458US9169409B2Ink composition for imprint lithography and roll printingLG DISPLAY CO LTD·Filed 2014·Granted Oct 27, 2015·0 cites·3 claims
- 1550US2011224335A1Ink composition and method of fabricating liquid crystal display device using the sameKIM SUNG-HEE·Filed 2011·Application pending·0 cites
- 1648US9860942B2Organic light emitting diode display deviceLG DISPLAY CO LTD·Filed 2013·Granted Jan 2, 2018·0 cites·20 claims
- 1744US7812929B2Electrostatic chuck with temperature sensing unit, exposure equipment having the same, and method of detecting temperature from photomaskSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Oct 12, 2010·0 cites·21 claims
- 1842US7646472B2Off-axis illumination apparatus, exposure apparatus and off-axis illumination methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 12, 2010·0 cites·10 claims
- 1942US2006269118A1Method of inspecting defects in photomask having a plurality of dies with different transmittancesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 2040US2019179225A1Photomasks, methods of manufacturing photomasks, and methods of manufacturing semiconductor device using photomasksSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2138US8522172B2Method of forming photomask using calibration pattern, and photomask having calibration patternYOON YOUNG-KEUN·Filed 2011·Granted Aug 27, 2013·0 cites·20 claims
- 2234US2007224522A1Substrate including deformed portions and method of adjusting a curvature of a substrateLEE MYOUNG-SOO·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →