Inventor · disambiguated record
Myungyoon Um
Also filed as: UM MYUNGYOON
9 granted patents·2 pending applications·8 citations·filing 2020–2025
79Inventor score
Files withSAMSUNG ELECTRONICS CO LTD11
Top patents by PatentIndex Score
11 records- 0194US11575044B2Integrated circuit deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 7, 2023·4 cites·20 claims
- 0293US11251306B2Integrated circuit deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Feb 15, 2022·3 cites·18 claims
- 0385US11757040B2Integrated circuit deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Sep 12, 2023·1 cites·19 claims
- 0478US12288749B2Integrated circuit chip including gate electrode with oblique cut surface, and manufacturing method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2024·Granted Apr 29, 2025·0 cites·20 claims
- 0573US2025210526A1Integrated circuit chip including gate electrode with oblique cut surface, and manufacturing method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0668US11996364B2Integrated circuit chip including gate electrode with oblique cut surface, and manufacturing method of the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 28, 2024·0 cites·20 claims
- 0763US2025204031A1Integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0862US12464810B2Integrated circuit device having inclined structuresSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 4, 2025·0 cites·20 claims
- 0962US12288788B2Integrated circuit devicesSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 29, 2025·0 cites·20 claims
- 1052US11327107B2Testing method of a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted May 10, 2022·0 cites·20 claims
- 1148US12113109B2Semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Oct 8, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →