Inventor · disambiguated record
Naoto Ban
Also filed as: BAN NAOTO
18 granted patents·1 pending application·304 citations·filing 1994–2004
95Inventor score
Top patents by PatentIndex Score
19 records- 0193US6696849B2Fabrication method of semiconductor integrated circuit device and its testing apparatusRENESAS TECH CORP·Filed 2001·Granted Feb 24, 2004·75 cites·6 claims
- 0286US6358762B1Manufacture method for semiconductor inspection apparatusHITACHI LTD·Filed 2000·Granted Mar 19, 2002·38 cites·16 claims
- 0379US6455335B1Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2000·Granted Sep 24, 2002·17 cites·10 claims
- 0478US6496023B1Semiconductor-device inspecting apparatus and a method for manufacturing the sameHITACHI LTD·Filed 2000·Granted Dec 17, 2002·20 cites·12 claims
- 0577US6566150B2Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2002·Granted May 20, 2003·15 cites·1 claims
- 0675US6774654B2Semiconductor-device inspecting apparatus and a method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Aug 10, 2004·16 cites·14 claims
- 0770US6828810B2Semiconductor device testing apparatus and method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Dec 7, 2004·14 cites·13 claims
- 0862US6548315B2Manufacture method for semiconductor inspection apparatusHITACHI LTD·Filed 2002·Granted Apr 15, 2003·8 cites·7 claims
- 0962US5532909AReflector for a vehicular lamp and method of producing a die thereforKOITO MFG CO LTD·Filed 1994·Granted Jul 2, 1996·21 cites·14 claims
- 1061US6714030B2Semiconductor inspection apparatusHITACHI LTD·Filed 2003·Granted Mar 30, 2004·7 cites·5 claims
- 1160US6573112B2Semiconductor device manufacturing methodHITACHI LTD·Filed 2002·Granted Jun 3, 2003·6 cites·10 claims
- 1259US6566149B1Method for manufacturing substrate for inspecting semiconductor deviceHITACHI LTD·Filed 1998·Granted May 20, 2003·22 cites·14 claims
- 1356US6864695B2Semiconductor device testing apparatus and semiconductor device manufacturing method using itRENESAS TECH CORP·Filed 2001·Granted Mar 8, 2005·5 cites·7 claims
- 1454US6511857B1Process for manufacturing semiconductor deviceHITACHI LTD·Filed 1999·Granted Jan 28, 2003·15 cites·18 claims
- 1553US6197603B1Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 1998·Granted Mar 6, 2001·12 cites·4 claims
- 1650US7198962B2Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test stepHITACHI LTD·Filed 2003·Granted Apr 3, 2007·3 cites·5 claims
- 1745US6479305B2Semiconductor device manufacturing methodHITACHI LTD·Filed 1999·Granted Nov 12, 2002·10 cites·13 claims
- 1841US2004135593A1Fabrication method of semiconductor integrated circuit device and its testing apparatusFiled 2004·Application pending·0 cites
- 1939US7119362B2Method of manufacturing semiconductor apparatusRENESAS TECH CORP·Filed 2002·Granted Oct 10, 2006·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →