Inventor · disambiguated record
Nasser Barabi
Also filed as: BARABI NASSER · BARABI NASSER J
24 granted patents·8 pending applications·175 citations·filing 2006–2024
95Inventor score
Top patents by PatentIndex Score
32 records- 0198US10908207B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2016·Granted Feb 2, 2021·31 cites·4 claims
- 0298US10126356B2Systems and methods for conforming test tooling to integrated circuit device with whirlwind cold plateESSAI INC·Filed 2016·Granted Nov 13, 2018·30 cites·17 claims
- 0396US11378588B2Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2020·Granted Jul 5, 2022·3 cites·10 claims
- 0494US8508245B1Thermal control unit used to maintain the temperature of IC devices under testBARABI NASSER·Filed 2010·Granted Aug 13, 2013·21 cites·11 claims
- 0592US7663388B2Active thermal control unit for maintaining the set point temperature of a DUTESSAI INC·Filed 2008·Granted Feb 16, 2010·26 cites·16 claims
- 0690US9046568B2Universal spring contact pin and IC test socket thereforHO CHEE-WAH·Filed 2010·Granted Jun 2, 2015·15 cites·29 claims
- 0789US10481175B2Contactor with angled depressible probesESSAI INC·Filed 2017·Granted Nov 19, 2019·3 cites·22 claims
- 0887US9804223B2Systems and methods for conforming test tooling to integrated circuit device with heater socketESSAI INC·Filed 2015·Granted Oct 31, 2017·4 cites·19 claims
- 0984US8493085B2Spring contact pin for an ic test socket and the likeBARABI NASSER·Filed 2010·Granted Jul 23, 2013·6 cites·11 claims
- 1081US11293976B1Integrated circuit device test tooling with dual angle cavitiesESSAI INC·Filed 2020·Granted Apr 5, 2022·1 cites·7 claims
- 1180US7651340B2Chip actuator cover assemblyESSAI INC·Filed 2008·Granted Jan 26, 2010·10 cites·29 claims
- 1279US9007080B2Systems and methods for conforming device testers to integrated circuit device profiles with feedback temperature controlESSAI INC·Filed 2013·Granted Apr 14, 2015·4 cites·11 claims
- 1376US9766268B2Contactor with angled spring probesBARABI NASSER·Filed 2007·Granted Sep 19, 2017·8 cites·22 claims
- 1476US2024345132A1Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 1575US8653842B2Systems and methods for thermal control of integrated circuits during testingBARABI NASSER·Filed 2011·Granted Feb 18, 2014·2 cites·9 claims
- 1673US9383406B2Systems and methods for conforming device testers to integrated circuit device with pressure relief valveESSAI INC·Filed 2014·Granted Jul 5, 2016·2 cites·3 claims
- 1772US2022413010A1Contactor with angled depressible probes in shifted boresESSAI INC·Filed 2022·Application pending·0 cites
- 1870US8981802B2Systems and methods for conforming device testers to integrated circuit device profilesBARABI NASSER·Filed 2012·Granted Mar 17, 2015·3 cites·11 claims
- 1968US12085587B2Hybrid shielding sockets with impedance tuning for integrated circuit device test toolingESSAI INC·Filed 2021·Granted Sep 10, 2024·0 cites·7 claims
- 2068US9494642B2Systems and methods for conforming test tooling to integrated circuit device profiles with ejection mechanismsESSAI INC·Filed 2013·Granted Nov 15, 2016·2 cites·8 claims
- 2167US2020225264A1Contactor with angled depressible probesESSAI INC·Filed 2019·Application pending·0 cites
- 2263US7583097B2Contactor nest for an IC device and methodESSAI INC·Filed 2006·Granted Sep 1, 2009·4 cites·21 claims
- 2360US2025237697A1Systems and methods for tool-less, quick change elastomeric contact interfaces for integrated circuit testingESSAI INC·Filed 2024·Application pending·0 cites
- 2458US2025085309A1Low cross-talk interconnection device with impedance-tuned hybrid shielding structures for integrated circuit device test toolingESSAI INC·Filed 2024·Application pending·0 cites
- 2552US9557373B2Systems and methods for conforming test tooling to integrated circuit device profiles with convex support structureESSAI INC·Filed 2014·Granted Jan 31, 2017·0 cites·12 claims
- 2648US11906550B2Probe system for QFP integrated circuit device test toolingESSAI INC·Filed 2021·Granted Feb 20, 2024·0 cites·6 claims
- 2746US9229049B2Systems and methods for conforming test tooling to integrated circuit device profiles with compliant pedestalsESSAI INC·Filed 2013·Granted Jan 5, 2016·0 cites·12 claims
- 2845US2015022226A1Systems and methods for conforming test tooling to integrated circuit device profiles with coaxial socketESSAI INC·Filed 2014·Application pending·0 cites
- 2943US10094853B2Systems and methods for reliable integrated circuit device test toolingESSAI INC·Filed 2015·Granted Oct 9, 2018·0 cites·14 claims
- 3043US9279852B2Systems and methods for conforming test tooling to integrated circuit device profiles with sockets having secured and replaceable bushingsESSAI INC·Filed 2013·Granted Mar 8, 2016·0 cites·2 claims
- 3141US2020379010A1Systems and methods for high speed test probing of densely packaged semiconductor devicesESSAI INC·Filed 2020·Application pending·0 cites
- 3237US2007018666A1Spring contact pin for an IC chip testerBARABI NASSER·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →