Inventor · disambiguated record
Narendra Devta-Prasanna
Also filed as: DEVTA PRASANNA NARENDRA B · DEVTA-PRASANNA NARENDRA
10 granted patents·78 citations·filing 2005–2010
88Inventor score
Files withLSI CORP5DEVTA-PRASANNA NARENDRA B2DEVTA-PRASANNA NARENDRA1GOEL SANDEEP KUMAR1LSI LOGIC CORP1
Top patents by PatentIndex Score
10 records- 0189US7555688B2Method for implementing test generation for systematic scan reconfiguration in an integrated circuitLSI LOGIC CORP·Filed 2005·Granted Jun 30, 2009·24 cites·16 claims
- 0287US8627160B2System and device for reducing instantaneous voltage droop during a scan shift operationDEVTA-PRASANNA NARENDRA·Filed 2010·Granted Jan 7, 2014·13 cites·18 claims
- 0381US7461307B2System and method for improving transition delay fault coverage in delay fault tests through use of an enhanced scan flip-flopLSI CORP·Filed 2005·Granted Dec 2, 2008·12 cites·20 claims
- 0479US8412994B2Design-for-test technique to reduce test volume including a clock gate controllerDEVTA-PRASANNA NARENDRA B·Filed 2010·Granted Apr 2, 2013·6 cites·20 claims
- 0575US7293210B2System and method for improving transition delay fault coverage in delay fault tests through use of transition launch flip-flopLSI CORP·Filed 2005·Granted Nov 6, 2007·8 cites·22 claims
- 0669US7802159B1Enhanced logic built-in self-test module and method of online system testing employing the sameLSI CORP·Filed 2008·Granted Sep 21, 2010·5 cites·20 claims
- 0761US8352818B2Method for generating test patterns for small delay defectsLSI CORP·Filed 2008·Granted Jan 8, 2013·4 cites·22 claims
- 0860US8140923B2Test circuit and method for testing of infant mortality related defectsGOEL SANDEEP KUMAR·Filed 2009·Granted Mar 20, 2012·3 cites·21 claims
- 0954US7461315B2Method and system for improving quality of a circuit through non-functional test pattern identificationLSI CORP·Filed 2005·Granted Dec 2, 2008·2 cites·18 claims
- 1046US8515695B2Method and an apparatus for evaluating small delay defect coverage of a test pattern set on an ICDEVTA-PRASANNA NARENDRA B·Filed 2009·Granted Aug 20, 2013·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →