Inventor · disambiguated record

Naya Ha

Also filed as: HA NAYA

4 granted patents·7 citations·filing 2016–2019

65Inventor score

Technology areasG06F

Files withSAMSUNG ELECTRONICS CO LTD4

Top patents by PatentIndex Score

4 records

0178US11256846B2System and method of analyzing integrated circuit in consideration of a process variation and a shiftSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 22, 2022·3 cites·20 claims
0272US10599130B2Method and system for manufacturing an integrated circuit in consideration of a local layout effectSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Mar 24, 2020·2 cites·17 claims
0372US10372869B2System and method of analyzing integrated circuit in consideration of a process variationSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Aug 6, 2019·2 cites·19 claims
0447US10817637B2System and method of designing integrated circuit by considering local layout effectSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 27, 2020·0 cites·16 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →