Inventor · disambiguated record
Naomi Higashino
Also filed as: HIGASHINO NAOMI
3 granted patents·47 citations·filing 1990–1995
71Inventor score
Files withMITSUBISHI ELECTRIC CORP3
Top patents by PatentIndex Score
3 records- 0160US5142223ADevice for testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1991·Granted Aug 25, 1992·24 cites·8 claims
- 0256US5485114ASemiconductor integrated circuit with internal compensation for changes in time delayMITSUBISHI ELECTRIC CORP·Filed 1995·Granted Jan 16, 1996·16 cites·8 claims
- 0337US5086280AContinuously variable pulsewidth waveform formation device employing two memoriesMITSUBISHI ELECTRIC CORP·Filed 1990·Granted Feb 4, 1992·7 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →