Inventor · disambiguated record
Naomi Ishii
Also filed as: ISHII NAOMI
6 granted patents·2 pending applications·6 citations·filing 2009–2021
70Inventor score
Top patents by PatentIndex Score
8 records- 0167US9430312B2Automated analysis systemHITACHI HIGH TECH CORP·Filed 2012·Granted Aug 30, 2016·2 cites·12 claims
- 0263US9229015B2Accuracy management methodLI QING·Filed 2009·Granted Jan 5, 2016·3 cites·17 claims
- 0353US9194876B2Sample inspection system and operating method for management server thereofTOKUNGA TATSUYA·Filed 2010·Granted Nov 24, 2015·1 cites·14 claims
- 0451US2024183870A1Analysis Device, Specimen Production Device, Inspection Device, Operation Method for Specimen Production Device, and Operation Method for Inspection DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0549US2024280476A1Analysis method and analysis deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 0644US9841413B2Data processing device and automatic analysis device using sameHITACHI HIGH TECH CORP·Filed 2013·Granted Dec 12, 2017·0 cites·3 claims
- 0739US9978044B2Analyzing deviceTAKI MIKI·Filed 2012·Granted May 22, 2018·0 cites·12 claims
- 0836US9377478B2Sample-test-device management server, sample test device, sample test system, and sample test methodNOGUCHI TAKASHI·Filed 2010·Granted Jun 28, 2016·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →