Inventor · disambiguated record
Najmi T. Jarwala
Also filed as: JARWALA NAJMI T · JARWALA NAJMI TAHER
8 granted patents·307 citations·filing 1987–1996
90Inventor score
Top patents by PatentIndex Score
8 records- 0186US5029166AMethod and apparatus for testing circuit boardsAT & T BELL LAB·Filed 1989·Granted Jul 2, 1991·54 cites·21 claims
- 0283US5673276ABoundary-scan-compliant multi-chip moduleLUCENT TECHNOLOGIES INC·Filed 1996·Granted Sep 30, 1997·62 cites·5 claims
- 0381US5048021AMethod and apparatus for generating control signalsAT & T BELL LAB·Filed 1989·Granted Sep 10, 1991·38 cites·12 claims
- 0470US5444716ABoundary-scan-based system and method for test and diagnosisAT & T CORP·Filed 1993·Granted Aug 22, 1995·65 cites·8 claims
- 0569US5155732AMethod and apparatus for data transfer to and from devices through a boundary-scan test access portAT & T BELL LAB·Filed 1990·Granted Oct 13, 1992·31 cites·4 claims
- 0667US5027353AMethod for testing interconnectionsAT & T BELL LAB·Filed 1989·Granted Jun 25, 1991·23 cites·3 claims
- 0763US5331274AMethod and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scanAT & T BELL LAB·Filed 1993·Granted Jul 19, 1994·24 cites·8 claims
- 0844US4833677AEasily testable high speed architecture for large RAMSUS AIR FORCE·Filed 1987·Granted May 23, 1989·10 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →